In this paper, we report a non-invasive and non-destructive probing method for analyzing the MG63 osteoblast-like cells. High frequency microwave atomic force microscope (M-AFM) can be used to measure the surface topography and microwave image of MG63 cells simultaneously in one scanning process. Under the frequency modulation AFM mode, the M-AFM probe tip can scan above the cell surface, maintaining a constant stand-off distance and the created lateral forces were small enough as not to sweep away or deform the fragile biomolecules. By analyzing the results, quantification such as, the number and distribution of organelles and proteins of MG63 cells as well as their dimension and electrical property information can be characterized. The unique potentials of that M-AFM imaging biological substrates with no damaging manner and nanometer scale resolution, while the original structure and function of the biomolecules during the investigation are preserved, make this technique very attractive to biologists.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Hardware and Architecture
- Electrical and Electronic Engineering