Microwave atomic force microscopy: Quantitative measurement and characterization of electrical properties on the nanometer scale

Lan Zhang, Yang Ju, Atsushi Hosoi, Akifumi Fujimoto

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In this paper, we report a noncontact and quantitative method of evaluating and characterizing electrical properties with a nanometer-scale spatial resolution. Microwave atomic force microscopy (M-AFM) can be used to obtain the topography and microwave image of materials in one scanning process simultaneously. Under the frequency modulation (FM) AFM mode, we successfully applied M-AFM to create a microwave image of a Au nanowire with a spatial resolution of 170 nm. Moreover, based on the analytical and explicit expressions proposed, M-AFM can implement the quantitative evaluation and characterization of the local conductivity of materials on the nanometer scale.

Original languageEnglish
Article number016602
JournalApplied Physics Express
Issue number1
Publication statusPublished - 2012 Jan 1


ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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