Modeling of wideband decoupling power line for millimeter-wave CMOS circuits

Ryuhei Goda, Shuhei Amakawa, Kosuke Katayama, Kyoya Takano, Takeshi Yoshida, Minoru Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Wideband decoupling for millimeter-wave circuits can be achieved using a transmission line having an extremely low characteristic impedance. The characteristic impedance of such a line can be estimated at high frequencies by measuring the input impedance of open and shorted stubs. However, since the propagation constant cannot be estimated reliably, a circuit model applicable to low frequencies has not yet been established. In this study, we extract the transmission-line parameters at low frequencies and build a circuit model using the RLGC parameters. This model is verified by comparing the results obtained from a circuit simulation and measurement data up to 40 GHz.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages151-153
Number of pages3
ISBN (Electronic)9781467377942
DOIs
Publication statusPublished - 2016 Jan 8
Externally publishedYes
EventIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Sendai, Japan
Duration: 2015 Aug 262015 Aug 28

Other

OtherIEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015
CountryJapan
CitySendai
Period15/8/2615/8/28

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Keywords

  • CMOS
  • Decoupling
  • Millimeter-wave
  • Modeling

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Goda, R., Amakawa, S., Katayama, K., Takano, K., Yoshida, T., & Fujishima, M. (2016). Modeling of wideband decoupling power line for millimeter-wave CMOS circuits. In 2015 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2015 - Proceedings (pp. 151-153). [7377917] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RFIT.2015.7377917