Modification of structural and optical properties of silica glass induced by ion microbeam

H. Nishikawa, M. Murai, T. Nakamura, Yoshimichi Ohki, M. Oikawa, T. Sato, T. Sakai, Y. Ishii, M. Fukuda

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.

    Original languageEnglish
    Pages (from-to)8185-8189
    Number of pages5
    JournalSurface and Coatings Technology
    Volume201
    Issue number19-20 SPEC. ISS.
    DOIs
    Publication statusPublished - 2007 Aug 5

    Fingerprint

    microbeams
    silica glass
    Fused silica
    Structural properties
    Optical properties
    Ions
    optical properties
    Ion bombardment
    ions
    Atomic force microscopy
    Compaction
    grooves
    Photoluminescence spectroscopy
    fluence
    atomic force microscopy
    Silicon Dioxide
    Nuclear energy
    Particle accelerators
    irradiation
    Refractive index

    Keywords

    • Atomic force microscopy
    • Ion microbeam
    • Photoluminescence
    • Refractive index
    • Silica glass

    ASJC Scopus subject areas

    • Surfaces, Coatings and Films
    • Condensed Matter Physics
    • Surfaces and Interfaces

    Cite this

    Nishikawa, H., Murai, M., Nakamura, T., Ohki, Y., Oikawa, M., Sato, T., ... Fukuda, M. (2007). Modification of structural and optical properties of silica glass induced by ion microbeam. Surface and Coatings Technology, 201(19-20 SPEC. ISS.), 8185-8189. https://doi.org/10.1016/j.surfcoat.2006.12.031

    Modification of structural and optical properties of silica glass induced by ion microbeam. / Nishikawa, H.; Murai, M.; Nakamura, T.; Ohki, Yoshimichi; Oikawa, M.; Sato, T.; Sakai, T.; Ishii, Y.; Fukuda, M.

    In: Surface and Coatings Technology, Vol. 201, No. 19-20 SPEC. ISS., 05.08.2007, p. 8185-8189.

    Research output: Contribution to journalArticle

    Nishikawa, H, Murai, M, Nakamura, T, Ohki, Y, Oikawa, M, Sato, T, Sakai, T, Ishii, Y & Fukuda, M 2007, 'Modification of structural and optical properties of silica glass induced by ion microbeam', Surface and Coatings Technology, vol. 201, no. 19-20 SPEC. ISS., pp. 8185-8189. https://doi.org/10.1016/j.surfcoat.2006.12.031
    Nishikawa, H. ; Murai, M. ; Nakamura, T. ; Ohki, Yoshimichi ; Oikawa, M. ; Sato, T. ; Sakai, T. ; Ishii, Y. ; Fukuda, M. / Modification of structural and optical properties of silica glass induced by ion microbeam. In: Surface and Coatings Technology. 2007 ; Vol. 201, No. 19-20 SPEC. ISS. pp. 8185-8189.
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    abstract = "Structural and optical properties of silica glass induced by ion microbeam irradiation were studied using micro- photoluminescence (μ-PL) spectroscopy and atomic force microscopy (AFM). Ion microbeam irradiation was performed using microbeam lines of 3-MV single-ended or tandem accelerators with various ion species including H+, He+, B3+, C4+, N4+, O4+, and Si5+ at energies of 1.7 to 18 MeV. The beam was focused to about 1 μm and was scanned over the surface of high-purity silica glass with fluences of 1013 to 1018 ions/cm2. The μ-PL spectrum in microbeam-irradiated silica shows two peaks at 540 and 650 nm. The mapping of the two PL bands reveals the distribution of defects induced along the track of ions. The compaction was observed in the form of groove at the surface of silica glass by AFM. The depth of the surface groove increases with increasing ion fluence and saturates at about several hundreds to 900 nm, depending on irradiated ion species. The mechanisms of structural and optical modifications of silica glass are can be understood in terms of energy loss due to electronic stopping and nuclear stopping powers. Refractive index changes with an order of 10- 4 to 10- 2 were estimated by a Lorentz-Lorenz relationship from the compaction. Technological implications of these results are also to be discussed.",
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