Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem

Yi Sun, Xin Wei, Shigeru Fujimura, Genke Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The semiconductor final testing scheduling problem (SFTSP) is a variation of the complex scheduling problem, which deals with the arrangement of the job sequence for the final testing process. In this paper, we present an actual SFTSP case includes almost all the flow-shop factors as reentry characteristic, serial and batch processing stages, lot-clusters and parallel machines. Since the critical equipment needs to be utilized efficiently at a specific testing stage, the scheduling arrangement is then playing an important role in order to reduce both the makespan and penalty cost of all late products in total final testing progress. On account of the difficulty and long time it takes to solve this problem, we propose a multi-objective optimization approach, which uses a lot-merging procedure, a new job-based encoding method, and an adjustment to the non-dominated sorting genetic algorithm II (NSGA-II). Simulation results of the adjusted NSGA-II on this SFTSP problem are compared with its traditional algorithm and much better performance of the adjusted one is observed.

Original languageEnglish
Title of host publicationAdvanced Materials Research
Pages152-157
Number of pages6
Volume622
DOIs
Publication statusPublished - 2013
Event2012 3rd International Conference on Manufacturing Science and Technology, ICMST 2012 - New Delhi
Duration: 2012 Aug 182012 Aug 19

Publication series

NameAdvanced Materials Research
Volume622
ISSN (Print)10226680

Other

Other2012 3rd International Conference on Manufacturing Science and Technology, ICMST 2012
CityNew Delhi
Period12/8/1812/8/19

Fingerprint

Multiobjective optimization
Scheduling
Semiconductor materials
Testing
Sorting
Genetic algorithms
Reentry
Merging
Costs

Keywords

  • Job-based encoding
  • Makespan
  • Multi-objective scheduling problem
  • Penalty cost
  • Reentrant flow-shop

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sun, Y., Wei, X., Fujimura, S., & Yang, G. (2013). Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem. In Advanced Materials Research (Vol. 622, pp. 152-157). (Advanced Materials Research; Vol. 622). https://doi.org/10.4028/www.scientific.net/AMR.622-623.152

Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem. / Sun, Yi; Wei, Xin; Fujimura, Shigeru; Yang, Genke.

Advanced Materials Research. Vol. 622 2013. p. 152-157 (Advanced Materials Research; Vol. 622).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sun, Y, Wei, X, Fujimura, S & Yang, G 2013, Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem. in Advanced Materials Research. vol. 622, Advanced Materials Research, vol. 622, pp. 152-157, 2012 3rd International Conference on Manufacturing Science and Technology, ICMST 2012, New Delhi, 12/8/18. https://doi.org/10.4028/www.scientific.net/AMR.622-623.152
Sun, Yi ; Wei, Xin ; Fujimura, Shigeru ; Yang, Genke. / Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem. Advanced Materials Research. Vol. 622 2013. pp. 152-157 (Advanced Materials Research).
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