Multi-resolution analysis based salient contour extraction

Jing Wang, Kazuo Kunieda, Makoto Iwata, Hirokazu Koizumi, Hideo Shimazu, Takeshi Ikenaga, Satoshi Goto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Detecting salient contours in complex backgrounds is important in image analysis and scene understanding. The local context of an edge or line segment feature is commonly used to measure its saliency degree as a part of the object boundary. However, traditionally the context information is captured by studying several features in the predefined neighborhood. In this paper, a novel salient contour extraction algorithm based on the multi-resolution analysis is proposed and a new saliency measure is defined to characterize the significance of feature. Relation of features that are corresponding to the same part of the object boundary across resolutions is utilized to estimate the context information and feature significance value. Experimental results show that the proposed method can extract salient contours more efficiently than center-surround interaction based methods and still provide robust results.

Original languageEnglish
Title of host publication2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages689-692
Number of pages4
ISBN (Print)0780397339, 9780780397330
DOIs
Publication statusPublished - 2006 Jan 1
Event2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06 - Yonago, Japan
Duration: 2006 Dec 122006 Dec 15

Publication series

Name2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06

Conference

Conference2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06
CountryJapan
CityYonago
Period06/12/1206/12/15

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ASJC Scopus subject areas

  • Computer Science Applications
  • Signal Processing
  • Software
  • Electrical and Electronic Engineering
  • Mathematics(all)

Cite this

Wang, J., Kunieda, K., Iwata, M., Koizumi, H., Shimazu, H., Ikenaga, T., & Goto, S. (2006). Multi-resolution analysis based salient contour extraction. In 2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06 (pp. 689-692). [4212367] (2006 International Symposium on Intelligent Signal Processing and Communications, ISPACS'06). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISPACS.2006.364749