Nano-scale evaluation of electrical tree initiation in silica/epoxy nano-composite thin film

Takuya Onishi, Shuichiro Hashimoto, Motohiro Tomita, Takanobu Watanabe, Kotaro Mura, Toshihiro Tsuda, Tetsuo Yoshimitsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Many researchers have attempted use of nanocomposite (NC) materials for insulation systems at various places. A number of studies on the propagation of electrical trees have been reported, but it has not yet been clarified how the electrical tree occurs inside the NC material. In order to evaluate the origin of an electrical tree, it is important to clarify the breakdown mechanism at nano-scale. In this paper, silica/epoxy-resin NC was spin-coated on a silicon substrate and characterized by thin film analyses. The scanning electron microscope (SEM) indicates uniform dispersion of silica fillers in the NC film. The time-To-breakdown of the NC film, which is measured using micro-electrical probe system, is improved as the silica density increases. Furthermore, we succeeded in the scanning tunneling microscope (STM) observation of the NC film. Leakage sites appeared in the STM images, which were induced by the electric stress application with the STM tip. These approaches will invoke a deep understanding of the role of nano-fillers in the insulation resistance and the breakdown mechanism of NC materials.

Original languageEnglish
Title of host publicationProceedings of 2017 International Symposium on Electrical Insulating Materials, ISEIM 2017
PublisherInstitute of Electrical Engineers of Japan
Pages359-362
Number of pages4
ISBN (Electronic)9784886860996
DOIs
Publication statusPublished - 2017 Oct 27
Event2017 International Symposium on Electrical Insulating Materials, ISEIM 2017 - Toyohashi, Japan
Duration: 2017 Sep 112017 Sep 15

Publication series

NameProceedings of the International Symposium on Electrical Insulating Materials
Volume1

Other

Other2017 International Symposium on Electrical Insulating Materials, ISEIM 2017
CountryJapan
CityToyohashi
Period17/9/1117/9/15

Keywords

  • Dielectric breakdown
  • Nano-composite
  • Scanning electron microscope (SEM)
  • Scanning tunneling microscope (STM)
  • Silica
  • Weibull plot

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Nano-scale evaluation of electrical tree initiation in silica/epoxy nano-composite thin film'. Together they form a unique fingerprint.

  • Cite this

    Onishi, T., Hashimoto, S., Tomita, M., Watanabe, T., Mura, K., Tsuda, T., & Yoshimitsu, T. (2017). Nano-scale evaluation of electrical tree initiation in silica/epoxy nano-composite thin film. In Proceedings of 2017 International Symposium on Electrical Insulating Materials, ISEIM 2017 (pp. 359-362). (Proceedings of the International Symposium on Electrical Insulating Materials; Vol. 1). Institute of Electrical Engineers of Japan. https://doi.org/10.23919/iseim.2017.8088759