Nanoscale characterization of domain structures in Bi4Ti 3O12 single crystals using near-field raman spectroscopy

Claudia Carmignano, Minoru Osada, Yuji Noguchi, Yuuki Kitanaka, Masaru Miyayama

    Research output: Contribution to journalArticle

    3 Citations (Scopus)

    Abstract

    We have investigated domain structures in Bi4Ti 3O12 (BiT) single crystals by Raman scattering using scanning near-field optical microscopy (SNOM). In SNOM-Raman spectra, the polarization dependence reflects domain structures, and the spectra at the domain-wall region exhibit the splitting of the TiO6 mode at ∼840 cm-1 with the appearance of additional peaks, the behavior of which is different from that observed in the single-domain region. From the resonant Raman spectra of highly deficient BiT single crystals, we find that the resonance is localized at oxygen vacancies in TiO6 octahedra, and planer defects, owing to oxygen vacancies, accumulate near the domain walls, causing a strong domain pinning.

    Original languageEnglish
    Article number09NE10
    JournalJapanese Journal of Applied Physics
    Volume50
    Issue number9 PART 3
    DOIs
    Publication statusPublished - 2011 Sep

    Fingerprint

    Near field scanning optical microscopy
    Raman spectroscopy
    Raman scattering
    near fields
    Domain walls
    Single crystals
    Oxygen vacancies
    single crystals
    Raman spectra
    domain wall
    microscopy
    scanning
    oxygen
    Polarization
    Defects
    defects
    polarization

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

    Cite this

    Nanoscale characterization of domain structures in Bi4Ti 3O12 single crystals using near-field raman spectroscopy. / Carmignano, Claudia; Osada, Minoru; Noguchi, Yuji; Kitanaka, Yuuki; Miyayama, Masaru.

    In: Japanese Journal of Applied Physics, Vol. 50, No. 9 PART 3, 09NE10, 09.2011.

    Research output: Contribution to journalArticle

    Carmignano, Claudia ; Osada, Minoru ; Noguchi, Yuji ; Kitanaka, Yuuki ; Miyayama, Masaru. / Nanoscale characterization of domain structures in Bi4Ti 3O12 single crystals using near-field raman spectroscopy. In: Japanese Journal of Applied Physics. 2011 ; Vol. 50, No. 9 PART 3.
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