Nb based te barrier josephson junctions

Koichi Nagata, Shingo Uehara, Azusa Matsuda, Hideaki Takayanagi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A study was made on Nb based Josephson junctions with evaporated Te barriers. As the first step, a Nb-Te-Pb configuration was tested. The smooth surfaced Nb electrode enabled the formation of a pinhole free barrier. Supercurrent density was found to be large compared to that for surface oxidized junctions. As the second step, a Nb-Te-Nb structure was tested. Although the junction uniformity was not as good as that of the Nb-Te-Pb junctions, the aging property was drastically improved. Considerations were made on the origin of the remaining aging. The junctions showed excellent response to 50 GHz signals.

Original languageEnglish
Pages (from-to)771-774
Number of pages4
JournalIEEE Transactions on Magnetics
Volume17
Issue number1
DOIs
Publication statusPublished - 1981 Jan
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Nb based te barrier josephson junctions'. Together they form a unique fingerprint.

  • Cite this