Nb based te barrier josephson junctions

Koichi Nagata; Shingo Uehara; Azusa Matsuda; Hideaki Takayanagi

doi:10.1109/TMAG.1981.1060943

Nb based te barrier josephson junctions

Koichi Nagata, Shingo Uehara, Azusa Matsuda, Hideaki Takayanagi

School of Advanced Science and Engineering

Research output: Contribution to journal › Article

2 Citations (Scopus)

Abstract

A study was made on Nb based Josephson junctions with evaporated Te barriers. As the first step, a Nb-Te-Pb configuration was tested. The smooth surfaced Nb electrode enabled the formation of a pinhole free barrier. Supercurrent density was found to be large compared to that for surface oxidized junctions. As the second step, a Nb-Te-Nb structure was tested. Although the junction uniformity was not as good as that of the Nb-Te-Pb junctions, the aging property was drastically improved. Considerations were made on the origin of the remaining aging. The junctions showed excellent response to 50 GHz signals.

Original language	English
Pages (from-to)	771-774
Number of pages	4
Journal	IEEE Transactions on Magnetics
Volume	17
Issue number	1
DOIs	https://doi.org/10.1109/TMAG.1981.1060943
Publication status	Published - 1981 Jan

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ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

Nagata, K., Uehara, S., Matsuda, A., & Takayanagi, H. (1981). Nb based te barrier josephson junctions. IEEE Transactions on Magnetics, 17(1), 771-774. https://doi.org/10.1109/TMAG.1981.1060943

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Access to Document

10.1109/TMAG.1981.1060943