Abstract
The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
| Original language | English |
|---|---|
| Pages (from-to) | 398-403 |
| Number of pages | 6 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 19 |
| Issue number | 2 |
| Publication status | Published - 2002 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Computer Vision and Pattern Recognition
Cite this
Near-field intensity distribution of waves scattered from slightly rough surfaces. / Kawanishi, Tetsuya.
In: Journal of the Optical Society of America A: Optics and Image Science, and Vision, Vol. 19, No. 2, 2002, p. 398-403.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Near-field intensity distribution of waves scattered from slightly rough surfaces
AU - Kawanishi, Tetsuya
PY - 2002
Y1 - 2002
N2 - The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
AB - The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
UR - http://www.scopus.com/inward/record.url?scp=0013353596&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0013353596&partnerID=8YFLogxK
M3 - Article
C2 - 11822604
AN - SCOPUS:0013353596
VL - 19
SP - 398
EP - 403
JO - Journal of the Optical Society of America. A, Optics and image science
JF - Journal of the Optical Society of America. A, Optics and image science
SN - 1084-7529
IS - 2
ER -