Abstract
The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
| Original language | English |
|---|---|
| Pages (from-to) | 398-403 |
| Number of pages | 6 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 19 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2002 Feb |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Computer Vision and Pattern Recognition