New ion counting system for laser sputtered neutral mass spectrometry

Shingo Ichimura, H. Shimizu, K. Kokuban, H. Hashizume, K. Goto

Research output: Contribution to journalConference article

Abstract

In sputtered neutrals mass spectrometry (SNMS) with a laser for post-ionization a bunch of ions is generated within a short period corresponding to a laser pulse width (typically, a few tens of nanoseconds). The number of ions exceeds 100 under some conditions, so that a peak counting ability close to 1010 is necessary to detect all of them. The authors used an analog detection system for this purpose, but it was found to suffer from signal fluctuation, particularly when the primary ion beam current was low. They therefore developed a new counting system in which a bunch of ions incident on a microchannel plate is converted into photoradiating spots on a fluorescent screen. A charge coupled device camera records these spots and accumulates the signal for a (shutter opening) period. The signal is then transferred to a frame memory. Subsequently, a personal computer counts the 'events' in the frame memory.

Original languageEnglish
Pages (from-to)1788-1789
Number of pages2
JournalVacuum
Volume41
Issue number7 -9 Pt3
Publication statusPublished - 1990 Dec 1
Externally publishedYes
EventSelected Proceedings of the 11th International Vacuum Congress - (IVC-11) and the 7th International Conference on Solid Surfaces - (ICSS-7) - Cologne, Ger
Duration: 1989 Sep 251989 Sep 29

Fingerprint

Mass spectrometry
counting
mass spectroscopy
Ions
Lasers
Fluorescent screens
lasers
Data storage equipment
ions
microchannel plates
shutters
personal computers
CCD cameras
Microchannels
beam currents
Personal computers
Ion beams
Ionization
Laser pulses
charge coupled devices

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

Cite this

Ichimura, S., Shimizu, H., Kokuban, K., Hashizume, H., & Goto, K. (1990). New ion counting system for laser sputtered neutral mass spectrometry. Vacuum, 41(7 -9 Pt3), 1788-1789.

New ion counting system for laser sputtered neutral mass spectrometry. / Ichimura, Shingo; Shimizu, H.; Kokuban, K.; Hashizume, H.; Goto, K.

In: Vacuum, Vol. 41, No. 7 -9 Pt3, 01.12.1990, p. 1788-1789.

Research output: Contribution to journalConference article

Ichimura, S, Shimizu, H, Kokuban, K, Hashizume, H & Goto, K 1990, 'New ion counting system for laser sputtered neutral mass spectrometry', Vacuum, vol. 41, no. 7 -9 Pt3, pp. 1788-1789.
Ichimura S, Shimizu H, Kokuban K, Hashizume H, Goto K. New ion counting system for laser sputtered neutral mass spectrometry. Vacuum. 1990 Dec 1;41(7 -9 Pt3):1788-1789.
Ichimura, Shingo ; Shimizu, H. ; Kokuban, K. ; Hashizume, H. ; Goto, K. / New ion counting system for laser sputtered neutral mass spectrometry. In: Vacuum. 1990 ; Vol. 41, No. 7 -9 Pt3. pp. 1788-1789.
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