New low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li, Chen Hu, Jun Yang, Zhe Zhang, Youhua Shi

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)245
Number of pages1
JournalDianzi Qijian/Journal of Electron Devices
Volume25
Issue number3
Publication statusPublished - 2002 Sep
Externally publishedYes

Fingerprint

Built-in self test
Shift registers
Feedback

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

New low power BIST methodology by altering the structure of linear feedback shift registers. / Li, Rui; Hu, Chen; Yang, Jun; Zhang, Zhe; Shi, Youhua.

In: Dianzi Qijian/Journal of Electron Devices, Vol. 25, No. 3, 09.2002, p. 245.

Research output: Contribution to journalArticle

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