New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

S. Kodaira, N. Yasuda, Nobuyuki Hasebe, T. Doke, S. Ota, K. Ogura

    Research output: Contribution to journalArticle

    15 Citations (Scopus)

    Abstract

    New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

    Original languageEnglish
    Pages (from-to)163-170
    Number of pages8
    JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Volume574
    Issue number1
    DOIs
    Publication statusPublished - 2007 Apr 21

    Fingerprint

    Detectors
    solid state
    Cosmic rays
    detectors
    nuclei
    Thickness measurement
    optical microscopes
    Optical systems
    micrometers
    Microscopes
    Iron
    iron
    sensors
    Sensors

    Keywords

    • Amount of bulk etch
    • Charge resolution
    • CR-39
    • Galactic cosmic rays
    • Local thickness
    • Mass resolution
    • Solid-state track detector
    • Track registration sensitivity
    • Trans-iron nuclei

    ASJC Scopus subject areas

    • Instrumentation
    • Nuclear and High Energy Physics

    Cite this

    New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector. / Kodaira, S.; Yasuda, N.; Hasebe, Nobuyuki; Doke, T.; Ota, S.; Ogura, K.

    In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 574, No. 1, 21.04.2007, p. 163-170.

    Research output: Contribution to journalArticle

    @article{06e799b99e9240b0b786b166f21af7b4,
    title = "New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector",
    abstract = "New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.",
    keywords = "Amount of bulk etch, Charge resolution, CR-39, Galactic cosmic rays, Local thickness, Mass resolution, Solid-state track detector, Track registration sensitivity, Trans-iron nuclei",
    author = "S. Kodaira and N. Yasuda and Nobuyuki Hasebe and T. Doke and S. Ota and K. Ogura",
    year = "2007",
    month = "4",
    day = "21",
    doi = "10.1016/j.nima.2007.01.086",
    language = "English",
    volume = "574",
    pages = "163--170",
    journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
    issn = "0168-9002",
    publisher = "Elsevier",
    number = "1",

    }

    TY - JOUR

    T1 - New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

    AU - Kodaira, S.

    AU - Yasuda, N.

    AU - Hasebe, Nobuyuki

    AU - Doke, T.

    AU - Ota, S.

    AU - Ogura, K.

    PY - 2007/4/21

    Y1 - 2007/4/21

    N2 - New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

    AB - New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

    KW - Amount of bulk etch

    KW - Charge resolution

    KW - CR-39

    KW - Galactic cosmic rays

    KW - Local thickness

    KW - Mass resolution

    KW - Solid-state track detector

    KW - Track registration sensitivity

    KW - Trans-iron nuclei

    UR - http://www.scopus.com/inward/record.url?scp=33947674333&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=33947674333&partnerID=8YFLogxK

    U2 - 10.1016/j.nima.2007.01.086

    DO - 10.1016/j.nima.2007.01.086

    M3 - Article

    AN - SCOPUS:33947674333

    VL - 574

    SP - 163

    EP - 170

    JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

    JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

    SN - 0168-9002

    IS - 1

    ER -