New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

S. Kodaira; N. Yasuda; Nobuyuki Hasebe; T. Doke; S. Ota; K. Ogura

doi:10.1016/j.nima.2007.01.086

New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

S. Kodaira, N. Yasuda, Nobuyuki Hasebe, T. Doke, S. Ota, K. Ogura

Research output: Contribution to journal › Article

16 Citations (Scopus)

Abstract

New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

Original language	English
Pages (from-to)	163-170
Number of pages	8
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	574
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2007.01.086
Publication status	Published - 2007 Apr 21

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Keywords

Amount of bulk etch
Charge resolution
CR-39
Galactic cosmic rays
Local thickness
Mass resolution
Solid-state track detector
Track registration sensitivity
Trans-iron nuclei

ASJC Scopus subject areas

Instrumentation
Nuclear and High Energy Physics

Cite this

Kodaira, S., Yasuda, N., Hasebe, N., Doke, T., Ota, S., & Ogura, K. (2007). New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 574(1), 163-170. https://doi.org/10.1016/j.nima.2007.01.086

New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector. / Kodaira, S.; Yasuda, N.; Hasebe, Nobuyuki; Doke, T.; Ota, S.; Ogura, K.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 574, No. 1, 21.04.2007, p. 163-170.

Research output: Contribution to journal › Article

Kodaira, S, Yasuda, N, Hasebe, N, Doke, T, Ota, S & Ogura, K 2007, 'New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 574, no. 1, pp. 163-170. https://doi.org/10.1016/j.nima.2007.01.086

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AU - Ota, S.

AU - Ogura, K.

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10.1016/j.nima.2007.01.086