New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

S. Kodaira, N. Yasuda, Nobuyuki Hasebe, T. Doke, S. Ota, K. Ogura

    Research output: Contribution to journalArticle

    16 Citations (Scopus)


    New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

    Original languageEnglish
    Pages (from-to)163-170
    Number of pages8
    JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    Issue number1
    Publication statusPublished - 2007 Apr 21



    • Amount of bulk etch
    • Charge resolution
    • CR-39
    • Galactic cosmic rays
    • Local thickness
    • Mass resolution
    • Solid-state track detector
    • Track registration sensitivity
    • Trans-iron nuclei

    ASJC Scopus subject areas

    • Instrumentation
    • Nuclear and High Energy Physics

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