Numerical simulation of critical current and n-value in Nb3Sn strand subjected to bending strain

Haruyuki Murakami, Atsushi Ishiyama, Hiroshi Ueda, Norikiyo Koizumi, Kiyoshi Okuno

    Research output: Contribution to journalArticle

    18 Citations (Scopus)

    Abstract

    Critical current of ITER model coil degraded with the increase of electromagnetic force. Analysis based on results of the experiments in which periodic transverse load is artificially applied to single strand showed that periodic bending of the strand by transverse load caused this degradation. However, since the experiments were carried out under a certain condition, general relation between transverse load and critical current was not obtained. We have therefore developed a numerical simulation code to investigate the general relation. However, there were some disagreements between the simulation and experimental results in our previous study. Our simulation model was consequently modified, resulting in good agreement with the test results. The general dependence of the critical current on periodic transverse load, temperature, and pitch of periodic load is investigated using the modified simulation code. The simulation results reveal that the reduced critical current depends on the temperature, and is a function of the bending strain independent of the pitch of the periodic load.

    Original languageEnglish
    Pages (from-to)1394-1397
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Volume17
    Issue number2
    DOIs
    Publication statusPublished - 2007 Jun

    Fingerprint

    transverse loads
    Critical currents
    strands
    critical current
    Computer simulation
    simulation
    Loads (forces)
    Experiments
    Degradation
    coils
    Temperature
    degradation
    electromagnetism
    temperature

    Keywords

    • Bending load
    • CICC
    • Critical current
    • Current transfer
    • Degradation
    • Nb Sn strand
    • Numerical simulation

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Physics and Astronomy (miscellaneous)

    Cite this

    Numerical simulation of critical current and n-value in Nb3Sn strand subjected to bending strain. / Murakami, Haruyuki; Ishiyama, Atsushi; Ueda, Hiroshi; Koizumi, Norikiyo; Okuno, Kiyoshi.

    In: IEEE Transactions on Applied Superconductivity, Vol. 17, No. 2, 06.2007, p. 1394-1397.

    Research output: Contribution to journalArticle

    Murakami, Haruyuki ; Ishiyama, Atsushi ; Ueda, Hiroshi ; Koizumi, Norikiyo ; Okuno, Kiyoshi. / Numerical simulation of critical current and n-value in Nb3Sn strand subjected to bending strain. In: IEEE Transactions on Applied Superconductivity. 2007 ; Vol. 17, No. 2. pp. 1394-1397.
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    AU - Koizumi, Norikiyo

    AU - Okuno, Kiyoshi

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