Numerical simulation of critical current degradation of Nb3Sn strand in CIC conductor

Haruyuki Murakami, Atsushi Ishiyama, Hiroshi Ueda, Norikiyo Koizumi, Kiyoshi Okuno

Research output: Contribution to journalArticle

2 Citations (Scopus)

Fingerprint Dive into the research topics of 'Numerical simulation of critical current degradation of Nb<sub>3</sub>Sn strand in CIC conductor'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science