Observing diamond defects with an analytical color fluorescence electron microscope

Kazuhito Nishimura, Tohru Nakano, Hirotami Koike, Hiroshi Tomimori, Hiroshi Kawarada, Akio Hiraki, Kazuo Ogawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsAlbert Feldman, Sandor Holly
PublisherPubl by Int Soc for Optical Engineering
Pages267-282
Number of pages16
Volume1325
Publication statusPublished - 1990
Externally publishedYes
EventDiamond Optics III - San Diego, CA, USA
Duration: 1990 Jul 91990 Jul 11

Other

OtherDiamond Optics III
CitySan Diego, CA, USA
Period90/7/990/7/11

Fingerprint

Diamonds
Electron microscopes
electron microscopes
Fluorescence
diamonds
Color
color
fluorescence
Defects
defects
Cathodoluminescence
Secondary ion mass spectrometry
cathodoluminescence
secondary ion mass spectrometry
Chemical vapor deposition
Doping (additives)
vapor deposition
Wavelength
wavelengths

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Nishimura, K., Nakano, T., Koike, H., Tomimori, H., Kawarada, H., Hiraki, A., & Ogawa, K. (1990). Observing diamond defects with an analytical color fluorescence electron microscope. In A. Feldman, & S. Holly (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1325, pp. 267-282). Publ by Int Soc for Optical Engineering.

Observing diamond defects with an analytical color fluorescence electron microscope. / Nishimura, Kazuhito; Nakano, Tohru; Koike, Hirotami; Tomimori, Hiroshi; Kawarada, Hiroshi; Hiraki, Akio; Ogawa, Kazuo.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Albert Feldman; Sandor Holly. Vol. 1325 Publ by Int Soc for Optical Engineering, 1990. p. 267-282.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nishimura, K, Nakano, T, Koike, H, Tomimori, H, Kawarada, H, Hiraki, A & Ogawa, K 1990, Observing diamond defects with an analytical color fluorescence electron microscope. in A Feldman & S Holly (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 1325, Publ by Int Soc for Optical Engineering, pp. 267-282, Diamond Optics III, San Diego, CA, USA, 90/7/9.
Nishimura K, Nakano T, Koike H, Tomimori H, Kawarada H, Hiraki A et al. Observing diamond defects with an analytical color fluorescence electron microscope. In Feldman A, Holly S, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 1325. Publ by Int Soc for Optical Engineering. 1990. p. 267-282
Nishimura, Kazuhito ; Nakano, Tohru ; Koike, Hirotami ; Tomimori, Hiroshi ; Kawarada, Hiroshi ; Hiraki, Akio ; Ogawa, Kazuo. / Observing diamond defects with an analytical color fluorescence electron microscope. Proceedings of SPIE - The International Society for Optical Engineering. editor / Albert Feldman ; Sandor Holly. Vol. 1325 Publ by Int Soc for Optical Engineering, 1990. pp. 267-282
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