On-chip multibit-test scheme for VLSI memories

Hideto Hidaka*, Kazuyasu Fujishima, Masaki Kumanoya, Hideshi Miyatake, Katsumi Dosaka, Yasumasa Nishimura, Tsutomu Yoshihara

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'On-chip multibit-test scheme for VLSI memories'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science