On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

S. Amakawa, K. Takano, Kosuke Katayama, M. Motoyoshi, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

Original languageEnglish
Title of host publicationProceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
Pages134-136
Number of pages3
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 - Singapore
Duration: 2012 Nov 212012 Nov 23

Other

Other2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
CitySingapore
Period12/11/2112/11/23

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Scattering parameters
Electric lines
Wavelength

Keywords

  • de-embedding
  • on-wafer measurement
  • renormalization transformation
  • S parameters
  • TSD

ASJC Scopus subject areas

  • Computer Networks and Communications

Cite this

Amakawa, S., Takano, K., Katayama, K., Motoyoshi, M., Yoshida, T., & Fujishima, M. (2012). On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. In Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 (pp. 134-136). [6401638] https://doi.org/10.1109/RFIT.2012.6401638

On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. / Amakawa, S.; Takano, K.; Katayama, Kosuke; Motoyoshi, M.; Yoshida, T.; Fujishima, M.

Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012. 2012. p. 134-136 6401638.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Amakawa, S, Takano, K, Katayama, K, Motoyoshi, M, Yoshida, T & Fujishima, M 2012, On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. in Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012., 6401638, pp. 134-136, 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012, Singapore, 12/11/21. https://doi.org/10.1109/RFIT.2012.6401638
Amakawa S, Takano K, Katayama K, Motoyoshi M, Yoshida T, Fujishima M. On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. In Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012. 2012. p. 134-136. 6401638 https://doi.org/10.1109/RFIT.2012.6401638
Amakawa, S. ; Takano, K. ; Katayama, Kosuke ; Motoyoshi, M. ; Yoshida, T. ; Fujishima, M. / On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012. 2012. pp. 134-136
@inproceedings{a2e6e4dc0e82405cbd21e686259d57ff,
title = "On the choice of cascade de-embedding methods for on-wafer S-parameter measurement",
abstract = "Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.",
keywords = "de-embedding, on-wafer measurement, renormalization transformation, S parameters, TSD",
author = "S. Amakawa and K. Takano and Kosuke Katayama and M. Motoyoshi and T. Yoshida and M. Fujishima",
year = "2012",
doi = "10.1109/RFIT.2012.6401638",
language = "English",
isbn = "9781467323048",
pages = "134--136",
booktitle = "Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012",

}

TY - GEN

T1 - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

AU - Amakawa, S.

AU - Takano, K.

AU - Katayama, Kosuke

AU - Motoyoshi, M.

AU - Yoshida, T.

AU - Fujishima, M.

PY - 2012

Y1 - 2012

N2 - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

AB - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

KW - de-embedding

KW - on-wafer measurement

KW - renormalization transformation

KW - S parameters

KW - TSD

UR - http://www.scopus.com/inward/record.url?scp=84873206491&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84873206491&partnerID=8YFLogxK

U2 - 10.1109/RFIT.2012.6401638

DO - 10.1109/RFIT.2012.6401638

M3 - Conference contribution

AN - SCOPUS:84873206491

SN - 9781467323048

SP - 134

EP - 136

BT - Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

ER -