On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

S. Amakawa, K. Takano, K. Katayama, M. Motoyoshi, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

Original languageEnglish
Title of host publicationProceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
Pages134-136
Number of pages3
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 - Singapore, Singapore
Duration: 2012 Nov 212012 Nov 23

Publication series

NameProceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

Conference

Conference2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012
CountrySingapore
CitySingapore
Period12/11/2112/11/23

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Keywords

  • S parameters
  • TSD
  • de-embedding
  • on-wafer measurement
  • renormalization transformation

ASJC Scopus subject areas

  • Computer Networks and Communications

Cite this

Amakawa, S., Takano, K., Katayama, K., Motoyoshi, M., Yoshida, T., & Fujishima, M. (2012). On the choice of cascade de-embedding methods for on-wafer S-parameter measurement. In Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 (pp. 134-136). [6401638] (Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012). https://doi.org/10.1109/RFIT.2012.6401638