TY - GEN

T1 - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

AU - Amakawa, S.

AU - Takano, K.

AU - Katayama, K.

AU - Motoyoshi, M.

AU - Yoshida, T.

AU - Fujishima, M.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

AB - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

KW - S parameters

KW - TSD

KW - de-embedding

KW - on-wafer measurement

KW - renormalization transformation

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U2 - 10.1109/RFIT.2012.6401638

DO - 10.1109/RFIT.2012.6401638

M3 - Conference contribution

AN - SCOPUS:84873206491

SN - 9781467323048

T3 - Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

SP - 134

EP - 136

BT - Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

T2 - 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

Y2 - 21 November 2012 through 23 November 2012

ER -