### Abstract

Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Z_{χ}, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Z_{χ} at low frequencies, from which Z_{χ} can be extrapolated to higher frequencies.

Original language | English |
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Title of host publication | Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 |

Pages | 134-136 |

Number of pages | 3 |

DOIs | |

Publication status | Published - 2012 |

Externally published | Yes |

Event | 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 - Singapore Duration: 2012 Nov 21 → 2012 Nov 23 |

### Other

Other | 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 |
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City | Singapore |

Period | 12/11/21 → 12/11/23 |

### Fingerprint

### Keywords

- de-embedding
- on-wafer measurement
- renormalization transformation
- S parameters
- TSD

### ASJC Scopus subject areas

- Computer Networks and Communications

### Cite this

*Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012*(pp. 134-136). [6401638] https://doi.org/10.1109/RFIT.2012.6401638

**On the choice of cascade de-embedding methods for on-wafer S-parameter measurement.** / Amakawa, S.; Takano, K.; Katayama, Kosuke; Motoyoshi, M.; Yoshida, T.; Fujishima, M.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

*Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012.*, 6401638, pp. 134-136, 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012, Singapore, 12/11/21. https://doi.org/10.1109/RFIT.2012.6401638

}

TY - GEN

T1 - On the choice of cascade de-embedding methods for on-wafer S-parameter measurement

AU - Amakawa, S.

AU - Takano, K.

AU - Katayama, Kosuke

AU - Motoyoshi, M.

AU - Yoshida, T.

AU - Fujishima, M.

PY - 2012

Y1 - 2012

N2 - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

AB - Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Zχ, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Zχ at low frequencies, from which Zχ can be extrapolated to higher frequencies.

KW - de-embedding

KW - on-wafer measurement

KW - renormalization transformation

KW - S parameters

KW - TSD

UR - http://www.scopus.com/inward/record.url?scp=84873206491&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84873206491&partnerID=8YFLogxK

U2 - 10.1109/RFIT.2012.6401638

DO - 10.1109/RFIT.2012.6401638

M3 - Conference contribution

AN - SCOPUS:84873206491

SN - 9781467323048

SP - 134

EP - 136

BT - Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012

ER -