### Abstract

Performance of thru-only cascade de-embedding methods and their variants that use a Π- or a T-equivalent to represent and bisect a symmetric THRU is assessed. The results from the Π- and T-based methods are reasonable at low frequencies. However they are shown to deviate noticeably from the correct results as the frequency gets high or, equivalently, when the length of the THRU approaches an effective wavelength λ. A better alternative at high frequencies is TSD (thru-short-delay), which, when THRU is symmetric, requires only THRU and LINE. TSD gives correct results except in the periodically appearing 'dead zones', provided that the characteristic impedance, Z_{χ}, of the transmission line (TL) in the LINE is known. A Π-based method could be used to extract Z_{χ} at low frequencies, from which Z_{χ} can be extrapolated to higher frequencies.

Original language | English |
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Title of host publication | Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 |

Pages | 134-136 |

Number of pages | 3 |

DOIs | |

Publication status | Published - 2012 Dec 1 |

Event | 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 - Singapore, Singapore Duration: 2012 Nov 21 → 2012 Nov 23 |

### Publication series

Name | Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 |
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### Conference

Conference | 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012 |
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Country | Singapore |

City | Singapore |

Period | 12/11/21 → 12/11/23 |

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### Keywords

- S parameters
- TSD
- de-embedding
- on-wafer measurement
- renormalization transformation

### ASJC Scopus subject areas

- Computer Networks and Communications

### Cite this

*Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012*(pp. 134-136). [6401638] (Proceedings of the 2012 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2012). https://doi.org/10.1109/RFIT.2012.6401638