On the length of THRU standard for TRL de-embedding on Si substrate above 110 GHz

A. Orii, M. Suizu, S. Amakawa, K. Katayama, K. Takano, M. Motoyoshi, T. Yoshida, M. Fujishima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Fingerprint

Dive into the research topics of 'On the length of THRU standard for TRL de-embedding on Si substrate above 110 GHz'. Together they form a unique fingerprint.

Engineering & Materials Science