Optimized free-form phase mask for extension of depth of field in wavefront-coded imaging

Yasuhisa Takahashi; Shinichi Komatsu

doi:10.1364/OL.33.001515

Optimized free-form phase mask for extension of depth of field in wavefront-coded imaging

Yasuhisa Takahashi, Shinichi Komatsu

Research output: Contribution to journal › Article › peer-review

50 Citations (Scopus)

Abstract

To achieve a further extension of the depth of field in wavefront-coded imaging by reducing the impact of focus error in the optical transfer function, we propose the use of a free-form phase mask (FPM) instead of a conventional cubic phase mask (CFM). We optimized the shape of the FPM using the simulated annealing algorithm and confirmed that the optimized FFM provides a much larger focal tolerance and better final images than the CPM in the noise-free case.

Original language	English
Pages (from-to)	1515-1517
Number of pages	3
Journal	Optics Letters
Volume	33
Issue number	13
DOIs	https://doi.org/10.1364/OL.33.001515
Publication status	Published - 2008 Jul 1

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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abstract = "To achieve a further extension of the depth of field in wavefront-coded imaging by reducing the impact of focus error in the optical transfer function, we propose the use of a free-form phase mask (FPM) instead of a conventional cubic phase mask (CFM). We optimized the shape of the FPM using the simulated annealing algorithm and confirmed that the optimized FFM provides a much larger focal tolerance and better final images than the CPM in the noise-free case.",

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