Optimized free-form phase mask for extension of depth of field in wavefront-coded imaging

Yasuhisa Takahashi, Shinichi Komatsu

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    47 Citations (Scopus)

    Abstract

    To achieve a further extension of the depth of field in wavefront-coded imaging by reducing the impact of focus error in the optical transfer function, we propose the use of a free-form phase mask (FPM) instead of a conventional cubic phase mask (CFM). We optimized the shape of the FPM using the simulated annealing algorithm and confirmed that the optimized FFM provides a much larger focal tolerance and better final images than the CPM in the noise-free case.

    Original languageEnglish
    Pages (from-to)1515-1517
    Number of pages3
    JournalOptics Letters
    Volume33
    Issue number13
    DOIs
    Publication statusPublished - 2008 Jul 1

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    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

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