Origin of green emission from ZnS nanobelts as revealed by scanning near-field optical microscopy

T. Tsuruoka; C. H. Liang; K. Terabe; T. Hasegawa

doi:10.1063/1.2890715

Origin of green emission from ZnS nanobelts as revealed by scanning near-field optical microscopy

T. Tsuruoka^*, C. H. Liang, K. Terabe, T. Hasegawa

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

The emission properties of ZnS nanobelts synthesized through thermal evaporation were investigated by means of scanning near-field optical microscopy. The photoluminescence (PL) images of single nanobelts exhibited a bright line along their length. The local light emission spectra measured over the bright lines showed a green emission peak around 535 nm, which was in good agreement with a PL peak obtained for an ensemble of the nanobelts. From careful scanning-electron-microscopy observations of identical nanobelts, we found that the observed green emission is related to line or planar defects of the ZnS nanobelts.

Original language	English
Article number	091908
Journal	Applied Physics Letters
Volume	92
Issue number	9
DOIs	https://doi.org/10.1063/1.2890715
Publication status	Published - 2008 Mar 14
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2890715

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title = "Origin of green emission from ZnS nanobelts as revealed by scanning near-field optical microscopy",

abstract = "The emission properties of ZnS nanobelts synthesized through thermal evaporation were investigated by means of scanning near-field optical microscopy. The photoluminescence (PL) images of single nanobelts exhibited a bright line along their length. The local light emission spectra measured over the bright lines showed a green emission peak around 535 nm, which was in good agreement with a PL peak obtained for an ensemble of the nanobelts. From careful scanning-electron-microscopy observations of identical nanobelts, we found that the observed green emission is related to line or planar defects of the ZnS nanobelts.",

author = "T. Tsuruoka and Liang, {C. H.} and K. Terabe and T. Hasegawa",

year = "2008",

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language = "English",

volume = "92",

journal = "Applied Physics Letters",

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T1 - Origin of green emission from ZnS nanobelts as revealed by scanning near-field optical microscopy

AU - Tsuruoka, T.

AU - Liang, C. H.

AU - Terabe, K.

AU - Hasegawa, T.

PY - 2008/3/14

Y1 - 2008/3/14

N2 - The emission properties of ZnS nanobelts synthesized through thermal evaporation were investigated by means of scanning near-field optical microscopy. The photoluminescence (PL) images of single nanobelts exhibited a bright line along their length. The local light emission spectra measured over the bright lines showed a green emission peak around 535 nm, which was in good agreement with a PL peak obtained for an ensemble of the nanobelts. From careful scanning-electron-microscopy observations of identical nanobelts, we found that the observed green emission is related to line or planar defects of the ZnS nanobelts.

AB - The emission properties of ZnS nanobelts synthesized through thermal evaporation were investigated by means of scanning near-field optical microscopy. The photoluminescence (PL) images of single nanobelts exhibited a bright line along their length. The local light emission spectra measured over the bright lines showed a green emission peak around 535 nm, which was in good agreement with a PL peak obtained for an ensemble of the nanobelts. From careful scanning-electron-microscopy observations of identical nanobelts, we found that the observed green emission is related to line or planar defects of the ZnS nanobelts.

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VL - 92

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 9

M1 - 091908

ER -

Origin of green emission from ZnS nanobelts as revealed by scanning near-field optical microscopy

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