Origins of sample-surface contaminants in loadlock chamber

Akira Kurokawa, Shingo Ichimura, Ken Nakamura, Hiroshi Itoh

Research output: Contribution to journalArticle

Abstract

The sample contamination in a loadlock chamber, caused by particle sticking, adsorption of gas and moisture in a loadlock chamber and back stream from pumping systems, was investigated. In order to eliminate the first two sources of contamination, a clean silicon sample was prepared in a glove box filled with particle-free nitrogen gas, and the sample was transferred to the loadlock chamber without exposing to air. To observe the contamination during pumping, the last source of contamination, a clean sample was set in the loadlock chamber and after evacuation surface contaminant was evaluated by C1s intensity of XPS spectra. Several evacuation procedures were compared and we concluded that oil-free pumping system is essentially important for contaminant-free introduction of a clean sample.

Original languageEnglish
Pages (from-to)247-250
Number of pages4
JournalShinku/Journal of the Vacuum Society of Japan
Volume43
Issue number3
DOIs
Publication statusPublished - 2000 Jan 1
Externally publishedYes

Fingerprint

contaminants
Contamination
chambers
Impurities
contamination
pumping
Gases
gloves
Silicon
Oils
Nitrogen
Moisture
gases
X ray photoelectron spectroscopy
moisture
boxes
Adsorption
oils
nitrogen
Air

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Origins of sample-surface contaminants in loadlock chamber. / Kurokawa, Akira; Ichimura, Shingo; Nakamura, Ken; Itoh, Hiroshi.

In: Shinku/Journal of the Vacuum Society of Japan, Vol. 43, No. 3, 01.01.2000, p. 247-250.

Research output: Contribution to journalArticle

Kurokawa, Akira ; Ichimura, Shingo ; Nakamura, Ken ; Itoh, Hiroshi. / Origins of sample-surface contaminants in loadlock chamber. In: Shinku/Journal of the Vacuum Society of Japan. 2000 ; Vol. 43, No. 3. pp. 247-250.
@article{a32458d0283c429695bb199e094171dc,
title = "Origins of sample-surface contaminants in loadlock chamber",
abstract = "The sample contamination in a loadlock chamber, caused by particle sticking, adsorption of gas and moisture in a loadlock chamber and back stream from pumping systems, was investigated. In order to eliminate the first two sources of contamination, a clean silicon sample was prepared in a glove box filled with particle-free nitrogen gas, and the sample was transferred to the loadlock chamber without exposing to air. To observe the contamination during pumping, the last source of contamination, a clean sample was set in the loadlock chamber and after evacuation surface contaminant was evaluated by C1s intensity of XPS spectra. Several evacuation procedures were compared and we concluded that oil-free pumping system is essentially important for contaminant-free introduction of a clean sample.",
author = "Akira Kurokawa and Shingo Ichimura and Ken Nakamura and Hiroshi Itoh",
year = "2000",
month = "1",
day = "1",
doi = "10.3131/jvsj.43.247",
language = "English",
volume = "43",
pages = "247--250",
journal = "Journal of the Vacuum Society of Japan",
issn = "1882-2398",
publisher = "Vacuum Society of Japan",
number = "3",

}

TY - JOUR

T1 - Origins of sample-surface contaminants in loadlock chamber

AU - Kurokawa, Akira

AU - Ichimura, Shingo

AU - Nakamura, Ken

AU - Itoh, Hiroshi

PY - 2000/1/1

Y1 - 2000/1/1

N2 - The sample contamination in a loadlock chamber, caused by particle sticking, adsorption of gas and moisture in a loadlock chamber and back stream from pumping systems, was investigated. In order to eliminate the first two sources of contamination, a clean silicon sample was prepared in a glove box filled with particle-free nitrogen gas, and the sample was transferred to the loadlock chamber without exposing to air. To observe the contamination during pumping, the last source of contamination, a clean sample was set in the loadlock chamber and after evacuation surface contaminant was evaluated by C1s intensity of XPS spectra. Several evacuation procedures were compared and we concluded that oil-free pumping system is essentially important for contaminant-free introduction of a clean sample.

AB - The sample contamination in a loadlock chamber, caused by particle sticking, adsorption of gas and moisture in a loadlock chamber and back stream from pumping systems, was investigated. In order to eliminate the first two sources of contamination, a clean silicon sample was prepared in a glove box filled with particle-free nitrogen gas, and the sample was transferred to the loadlock chamber without exposing to air. To observe the contamination during pumping, the last source of contamination, a clean sample was set in the loadlock chamber and after evacuation surface contaminant was evaluated by C1s intensity of XPS spectra. Several evacuation procedures were compared and we concluded that oil-free pumping system is essentially important for contaminant-free introduction of a clean sample.

UR - http://www.scopus.com/inward/record.url?scp=0033747728&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033747728&partnerID=8YFLogxK

U2 - 10.3131/jvsj.43.247

DO - 10.3131/jvsj.43.247

M3 - Article

AN - SCOPUS:0033747728

VL - 43

SP - 247

EP - 250

JO - Journal of the Vacuum Society of Japan

JF - Journal of the Vacuum Society of Japan

SN - 1882-2398

IS - 3

ER -