Oxidation in preparation of oxide superconducting films by MBE using NO2 and O3 gases

H. Nonaka, T. Shimizu, S. Hosokawa, Shingo Ichimura, K. Arai

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

In order to prepare oxide superconducting films by molecular beam epitaxy (MBE), we developed a compact NO2 supersonic molecular beam source and a new ozone jet generator to supply oxidizing gases with high controllability. Using these sources, oxide superconducting films of REBa2Cu3Ox (RE  Nd, Y) were prepared on either MgO or SrTiO3 substrates. Because of the sufficiently low pressure during deposition, the oxidation process of the metals, especially of copper, by the oxidizing gases and the crystallization and surface flatness of the films were studied in situ by XPS and reflection high‐energy electron diffraction (RHEED) together with effective cleaning of the substrates by the oxidizing gases.

Original languageEnglish
Pages (from-to)353-357
Number of pages5
JournalSurface and Interface Analysis
Volume19
Issue number1-12
DOIs
Publication statusPublished - 1992 Jan 1
Externally publishedYes

Fingerprint

Superconducting films
superconducting films
Molecular beam epitaxy
Oxide films
molecular beam epitaxy
Gases
Oxidation
preparation
oxidation
Molecular beams
oxides
Gas supply
Ozone
Substrates
Crystallization
Controllability
gases
Electron diffraction
Copper
Cleaning

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Oxidation in preparation of oxide superconducting films by MBE using NO2 and O3 gases. / Nonaka, H.; Shimizu, T.; Hosokawa, S.; Ichimura, Shingo; Arai, K.

In: Surface and Interface Analysis, Vol. 19, No. 1-12, 01.01.1992, p. 353-357.

Research output: Contribution to journalArticle

Nonaka, H. ; Shimizu, T. ; Hosokawa, S. ; Ichimura, Shingo ; Arai, K. / Oxidation in preparation of oxide superconducting films by MBE using NO2 and O3 gases. In: Surface and Interface Analysis. 1992 ; Vol. 19, No. 1-12. pp. 353-357.
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