Oxygen migration process in the interfaces during bipolar resistance switching behavior of WO 3-x-based nanoionics devices

Rui Yang, Kazuya Terabe, Tohru Tsuruoka, Tsuyoshi Hasegawa, Masakazu Aono

Research output: Contribution to journalArticle

38 Citations (Scopus)

Abstract

Bipolar resistance switching (BRS) behavior and the effects of atmosphere (air, vacuum, O 2 gas, or N 2 gas) on BRS behavior occurred in the top and bottom interfaces in the M (top electrode)/WO 3-x/Pt (bottom electrode) (M Pt, Au) devices were investigated. Stable BRS only can be obtained in the interface with Pt electrode. And, the top Pt/WO 3-x interface exhibited stable BRS only in an oxygen-rich atmosphere (air and O 2 gas). In contrast, the bottom WO 3-x/Pt interface showed stable BRS under any atmosphere. Based on the x-ray photoelectron spectroscopy measurement on Pt, Au/WO 3-x interfaces, it is identified that the oxygen migration process during resistance switching mainly occurs between the Pt/WO 3-x interface and Pt electrode.

Original languageEnglish
Article number231603
JournalApplied Physics Letters
Volume100
Issue number23
DOIs
Publication statusPublished - 2012 Jun 4
Externally publishedYes

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oxygen
electrodes
atmospheres
gases
air
x ray spectroscopy
photoelectron spectroscopy
vacuum

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Oxygen migration process in the interfaces during bipolar resistance switching behavior of WO 3-x-based nanoionics devices. / Yang, Rui; Terabe, Kazuya; Tsuruoka, Tohru; Hasegawa, Tsuyoshi; Aono, Masakazu.

In: Applied Physics Letters, Vol. 100, No. 23, 231603, 04.06.2012.

Research output: Contribution to journalArticle

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