Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications

Koji Tsumura, Hironori Washizaki, Yoshiaki Fukazawa, Keishi Oshima, Ryota Mibe

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)

    Abstract

    Because program behaviors of database applications depend on the data used, code coverages do not effectively test database applications. Additionally, test coverages for database applications that focus on predicates in Structured Query Language (SQL) queries are not useful if the necessary predicates are omitted. In this paper, we present two new database applications using Plain Pairwise Coverage (PPC) and Selected Pairwise Coverage (SPC) for SQL queries called Plain Pairwise Coverage Testing (PPCT) and Selected Pairwise Coverage Testing (SPCT), respectively. These coverages are based on pairwise testing coverage, which employs selected elements in the SQL SELECT query as parameters. We also implement a coverage calculation tool and conduct case studies on two open source software systems. PPCT and SPCT can detect many faults, which are not detected by existing test methods based on predicates in the query. Furthermore, the case study suggests that SPCT can detect faults more efficiently than PPCT and the costs of SPCT can be further reduced by ignoring records filtered out by the conditions of the query.

    Original languageEnglish
    Title of host publicationProceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages92-101
    Number of pages10
    ISBN (Electronic)9781509018260
    DOIs
    Publication statusPublished - 2016 Aug 1
    Event9th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016 - Chicago, United States
    Duration: 2016 Apr 102016 Apr 15

    Other

    Other9th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016
    CountryUnited States
    CityChicago
    Period16/4/1016/4/15

    Fingerprint

    Testing
    Query languages
    Costs

    Keywords

    • combinatorial testing
    • coverage
    • database testing
    • test data

    ASJC Scopus subject areas

    • Software
    • Safety, Risk, Reliability and Quality

    Cite this

    Tsumura, K., Washizaki, H., Fukazawa, Y., Oshima, K., & Mibe, R. (2016). Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications. In Proceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016 (pp. 92-101). [7528951] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSTW.2016.19

    Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications. / Tsumura, Koji; Washizaki, Hironori; Fukazawa, Yoshiaki; Oshima, Keishi; Mibe, Ryota.

    Proceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 92-101 7528951.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Tsumura, K, Washizaki, H, Fukazawa, Y, Oshima, K & Mibe, R 2016, Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications. in Proceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016., 7528951, Institute of Electrical and Electronics Engineers Inc., pp. 92-101, 9th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016, Chicago, United States, 16/4/10. https://doi.org/10.1109/ICSTW.2016.19
    Tsumura K, Washizaki H, Fukazawa Y, Oshima K, Mibe R. Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications. In Proceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 92-101. 7528951 https://doi.org/10.1109/ICSTW.2016.19
    Tsumura, Koji ; Washizaki, Hironori ; Fukazawa, Yoshiaki ; Oshima, Keishi ; Mibe, Ryota. / Pairwise Coverage-Based Testing with Selected Elements in a Query for Database Applications. Proceedings - 2016 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 92-101
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