PARASITIC RESISTANCE EFFECTS ON STATIC MOS RAM.

H. Shinohara, K. Anami, M. Yoshimoto, Y. Hirata, T. Nakano

Research output: Contribution to journalConference article

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)106-107
Number of pages2
JournalDigest of Technical Papers - Symposium on VLSI Technology
Publication statusPublished - 1982 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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