Pattern-dependent bit error characteristics induced by asymmetrically filtering of CS-RZ signal

A. Agata*, T. Tsuritani, I. Morita, N. Edagawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The pattern dependency in bit error characteristics of asymmetrically filtered CS-RZ signals has been experimentally and numerically studied. It was found that the bit error intensively occurs just after the end of a long sequence of 1s or 0s for strong asymmetrical filtering.

Original languageEnglish
Pages (from-to)1080-1081
Number of pages2
JournalElectronics Letters
Volume39
Issue number14
DOIs
Publication statusPublished - 2003 Jul 10
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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