Pattern-dependent bit error characteristics induced by asymmetrically filtering of CS-RZ signal

Akira Agata*, Takehiro Tsuritani, Itsuro Morita, Noboru Edagawa

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have experimentally and numerically studied the pattern dependency in bit error characteristics of asymmetrically filtered CS-RZ signals. We have found that the bit error intensively occurs just after the end of a long sequence of 1s or 0s for strong asymmetrical filtering.

Original languageEnglish
Title of host publicationOptical Amplifiers and Their Applications, OAA 2003
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781557528209
Publication statusPublished - 2003
Externally publishedYes
EventOptical Amplifiers and Their Applications, OAA 2003 - Otaru, Japan
Duration: 2003 Jul 62003 Jul 9

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceOptical Amplifiers and Their Applications, OAA 2003
Country/TerritoryJapan
CityOtaru
Period03/7/603/7/9

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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