A pattern recognition method for phytoplanktons (dinophysis fortii and dinophysis acuminata) is presented. The concept of syntactic pattern recognition with probability is used to determine the orientation of noisy shapes. A new type of Fourier descriptor that shows good performance, particularly for open curve segments, is used for the analysis of a feature line on the plankton's contour. This method is useful for identifying toxic plankton that spoil marine culture products.
|Title of host publication||Proceedings - International Conference on Pattern Recognition|
|Place of Publication||New York, NY, USA|
|Number of pages||3|
|Publication status||Published - 1986|
ASJC Scopus subject areas