Performance evaluation of low-noise analog front-end for semiconductor detectors

Tetsuichi Kishishita; Goro Sato; Hirokazu Ikeda; Tatsuya Kiyuna; Yoshio Mito; Tadayuki Takahashi

doi:10.1109/NSSMIC.2009.5402222

Performance evaluation of low-noise analog front-end for semiconductor detectors

Tetsuichi Kishishita^*, Goro Sato, Hirokazu Ikeda, Tatsuya Kiyuna, Yoshio Mito, Tadayuki Takahashi

^*Corresponding author for this work

Waseda Research Institute for Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report on the recent development of a low-noise analog front-end ASIC for hard X-ray and gamma-ray detectors. The ASIC aims for the readout of strip detectors utilizing silicon and cadmium telluride (CdTe) as detector materials. Each read-out channel includes a charge-sensitive amplifier, band-pass filters and sample-and-hold circuit. It also includes a leakage current compensation circuit to accommodate to the variety of solid-state detectors. The equivalent noise level of a typical channel reached 88 e^- + 8.1 e^-/pF (rms) for a power consumption of 3 mW per channel. We also evaluated the ASIC performances by combining with a CdTe line sensor.

Original language	English
Title of host publication	IEEE Nuclear Science Symposium Conference Record
Pages	1700-1702
Number of pages	3
DOIs	https://doi.org/10.1109/NSSMIC.2009.5402222
Publication status	Published - 2009
Event	2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 - Orlando, FL Duration: 2009 Oct 25 → 2009 Oct 31

Other

Other	2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
City	Orlando, FL
Period	09/10/25 → 09/10/31

Keywords

Analog front-end
ASIC
CdTe
Gamma-ray
Low noise
VLSI
X-ray

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

Access to Document

10.1109/NSSMIC.2009.5402222

Cite this

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title = "Performance evaluation of low-noise analog front-end for semiconductor detectors",

abstract = "We report on the recent development of a low-noise analog front-end ASIC for hard X-ray and gamma-ray detectors. The ASIC aims for the readout of strip detectors utilizing silicon and cadmium telluride (CdTe) as detector materials. Each read-out channel includes a charge-sensitive amplifier, band-pass filters and sample-and-hold circuit. It also includes a leakage current compensation circuit to accommodate to the variety of solid-state detectors. The equivalent noise level of a typical channel reached 88 e- + 8.1 e-/pF (rms) for a power consumption of 3 mW per channel. We also evaluated the ASIC performances by combining with a CdTe line sensor.",

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author = "Tetsuichi Kishishita and Goro Sato and Hirokazu Ikeda and Tatsuya Kiyuna and Yoshio Mito and Tadayuki Takahashi",

year = "2009",

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language = "English",

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AU - Kishishita, Tetsuichi

AU - Sato, Goro

AU - Ikeda, Hirokazu

AU - Kiyuna, Tatsuya

AU - Mito, Yoshio

AU - Takahashi, Tadayuki

PY - 2009

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AB - We report on the recent development of a low-noise analog front-end ASIC for hard X-ray and gamma-ray detectors. The ASIC aims for the readout of strip detectors utilizing silicon and cadmium telluride (CdTe) as detector materials. Each read-out channel includes a charge-sensitive amplifier, band-pass filters and sample-and-hold circuit. It also includes a leakage current compensation circuit to accommodate to the variety of solid-state detectors. The equivalent noise level of a typical channel reached 88 e- + 8.1 e-/pF (rms) for a power consumption of 3 mW per channel. We also evaluated the ASIC performances by combining with a CdTe line sensor.

KW - Analog front-end

KW - ASIC

KW - CdTe

KW - Gamma-ray

KW - Low noise

KW - VLSI

KW - X-ray

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Performance evaluation of low-noise analog front-end for semiconductor detectors

Abstract

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Keywords

ASJC Scopus subject areas

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