Phase transition and thermal behavior change of low silica X xeolite at [Al] = 90

Mana Yasui-Hiraiwa, Teruhisa Hongo, Hiroko Hayashi, Tetsuo Takaishi, Shinichi Nataka, Atsushi Yamazaki

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    Low silica X zeolite samples in the composition region of the number of Al atoms per unit cell ([Al]) between 84 and 96 were synthesized. X-ray diffraction and nuclear magnetic resonance analyses of the obtained samples verify the existence of the phase transition point and confirm the changes in the thermal behaviors of the samples at [Al] = 90.

    Original languageEnglish
    Pages (from-to)1242-1244
    Number of pages3
    JournalChemistry Letters
    Volume39
    Issue number12
    DOIs
    Publication statusPublished - 2010

    Fingerprint

    Zeolites
    Silicon Dioxide
    Phase transitions
    Nuclear magnetic resonance
    X ray diffraction
    Atoms
    Chemical analysis
    Hot Temperature

    ASJC Scopus subject areas

    • Chemistry(all)

    Cite this

    Phase transition and thermal behavior change of low silica X xeolite at [Al] = 90. / Yasui-Hiraiwa, Mana; Hongo, Teruhisa; Hayashi, Hiroko; Takaishi, Tetsuo; Nataka, Shinichi; Yamazaki, Atsushi.

    In: Chemistry Letters, Vol. 39, No. 12, 2010, p. 1242-1244.

    Research output: Contribution to journalArticle

    Yasui-Hiraiwa, M, Hongo, T, Hayashi, H, Takaishi, T, Nataka, S & Yamazaki, A 2010, 'Phase transition and thermal behavior change of low silica X xeolite at [Al] = 90', Chemistry Letters, vol. 39, no. 12, pp. 1242-1244. https://doi.org/10.1246/cl.2010.1242
    Yasui-Hiraiwa, Mana ; Hongo, Teruhisa ; Hayashi, Hiroko ; Takaishi, Tetsuo ; Nataka, Shinichi ; Yamazaki, Atsushi. / Phase transition and thermal behavior change of low silica X xeolite at [Al] = 90. In: Chemistry Letters. 2010 ; Vol. 39, No. 12. pp. 1242-1244.
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    AU - Nataka, Shinichi

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