Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Mamoru Iwabuchi, Tatsuhiko Fujii, Takeshi Kobayashi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

Original languageEnglish
Pages (from-to)491-494
Number of pages4
JournalJapanese journal of applied physics
Volume32
Issue number4 A
DOIs
Publication statusPublished - 1993 Apr
Externally publishedYes

Keywords

  • Built-in band bending
  • Diffusion length of YBa2Cu30K minority carriers
  • EBIC
  • Photoinduced short-circuit current
  • YBa2Cu30K MIS structure

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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