Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy

Uijin Jung, Kenta Kuwana, Hidetoshi Takahashi, Tetsuo Kan, Yusuke Takei, Kentaro Noda, Eiji Iwase, Kiyoshi Matsumoto, Isao Shimoyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents the design, fabrication, and the characterization of a photo-response compensated piezoresistive cantilever. The application field of the cantilever is to measure cellular mechanical properties under fluorescence microscopy. Photo-response which is caused by an excitation light of a fluorescence microscope interferes with measurement. We proposed piezoresistive cantilevers consist of a force-sensing cantilever with a reference cantilever to cancel out the photo-response. We measured the photo-response of the fabricated device, by varying wavelength, light intensity and light incidence angle. The experimental results show that the photo-response was decreased by 87%. This verified that present device has effective photo-response compensation by using the reference cantilever.

Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
Pages588-591
Number of pages4
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010 - Hong Kong
Duration: 2010 Jan 242010 Jan 28

Other

Other23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010
CityHong Kong
Period10/1/2410/1/28

Fingerprint

Fluorescence microscopy
microscopy
fluorescence
Microscopes
Fluorescence
Fabrication
Wavelength
Mechanical properties
luminous intensity
incidence
microscopes
mechanical properties
fabrication
wavelengths
excitation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Jung, U., Kuwana, K., Takahashi, H., Kan, T., Takei, Y., Noda, K., ... Shimoyama, I. (2010). Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy. In Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS) (pp. 588-591). [5442435] https://doi.org/10.1109/MEMSYS.2010.5442435

Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy. / Jung, Uijin; Kuwana, Kenta; Takahashi, Hidetoshi; Kan, Tetsuo; Takei, Yusuke; Noda, Kentaro; Iwase, Eiji; Matsumoto, Kiyoshi; Shimoyama, Isao.

Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS). 2010. p. 588-591 5442435.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jung, U, Kuwana, K, Takahashi, H, Kan, T, Takei, Y, Noda, K, Iwase, E, Matsumoto, K & Shimoyama, I 2010, Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy. in Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)., 5442435, pp. 588-591, 23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010, Hong Kong, 10/1/24. https://doi.org/10.1109/MEMSYS.2010.5442435
Jung U, Kuwana K, Takahashi H, Kan T, Takei Y, Noda K et al. Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy. In Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS). 2010. p. 588-591. 5442435 https://doi.org/10.1109/MEMSYS.2010.5442435
Jung, Uijin ; Kuwana, Kenta ; Takahashi, Hidetoshi ; Kan, Tetsuo ; Takei, Yusuke ; Noda, Kentaro ; Iwase, Eiji ; Matsumoto, Kiyoshi ; Shimoyama, Isao. / Photo-response compensated piezoresistive cantilever for use in fluorescence microscopy. Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS). 2010. pp. 588-591
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