Photoelectron studies of electrochemical diffusion of conducting polymer/transparent conductive metal oxide film interfaces

S. Takemura, H. Kato, Y. Nakajima

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

X-ray photoelectron spectroscopy (XPS) investigations of conducting polymer polythiophene (PT)/indium tin oxide (ITO) and PT/SnO2 interfaces have been conducted. Interfacial electrochemical diffusion of the metal oxide substrate species has been observed in both cases through electrochemical reduction process. XPS investigation has focused on the core-level energies and spectral profiles of the diffused substrate species into polymer matrix. A larger part of the diffused species is metal oxides in both cases determined by measuring chemical shifts of core-levels of In Sd5/2 and Sn Sd5/2. However, increase in lower binding energy components of In Sd5/2 and Sn Sd5/2 spectra of the diffused species indicates that the diffused species in polymer matrix are a mixture of metallic and oxide states of In and Sn. Furthermore, with regard to PT backbone-originated S 2p lines, a large splitting was observed indicating the large interaction between diffused metal oxides and sulfur sites of the polymer backbone.

Original languageEnglish
Pages (from-to)360-365
Number of pages6
JournalApplied Surface Science
Volume144-145
Issue number0
Publication statusPublished - 1999 Apr
Externally publishedYes

Keywords

  • Interfaces
  • Metal oxide film
  • Polymer backbone

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

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