Abstract
X-ray photoelectron spectroscopy (XPS) investigations of conducting polymer polythiophene (PT)/indium tin oxide (ITO) and PT/SnO2 interfaces have been conducted. Interfacial electrochemical diffusion of the metal oxide substrate species has been observed in both cases through electrochemical reduction process. XPS investigation has focused on the core-level energies and spectral profiles of the diffused substrate species into polymer matrix. A larger part of the diffused species is metal oxides in both cases determined by measuring chemical shifts of core-levels of In Sd5/2 and Sn Sd5/2. However, increase in lower binding energy components of In Sd5/2 and Sn Sd5/2 spectra of the diffused species indicates that the diffused species in polymer matrix are a mixture of metallic and oxide states of In and Sn. Furthermore, with regard to PT backbone-originated S 2p lines, a large splitting was observed indicating the large interaction between diffused metal oxides and sulfur sites of the polymer backbone.
| Original language | English |
|---|---|
| Pages (from-to) | 360-365 |
| Number of pages | 6 |
| Journal | Applied Surface Science |
| Volume | 144-145 |
| Issue number | 0 |
| Publication status | Published - 1999 Apr |
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Keywords
- Interfaces
- Metal oxide film
- Polymer backbone
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films
- Condensed Matter Physics
Cite this
Photoelectron studies of electrochemical diffusion of conducting polymer/transparent conductive metal oxide film interfaces. / Takemura, S.; Kato, H.; Nakajima, Y.
In: Applied Surface Science, Vol. 144-145, No. 0, 04.1999, p. 360-365.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Photoelectron studies of electrochemical diffusion of conducting polymer/transparent conductive metal oxide film interfaces
AU - Takemura, S.
AU - Kato, H.
AU - Nakajima, Y.
PY - 1999/4
Y1 - 1999/4
N2 - X-ray photoelectron spectroscopy (XPS) investigations of conducting polymer polythiophene (PT)/indium tin oxide (ITO) and PT/SnO2 interfaces have been conducted. Interfacial electrochemical diffusion of the metal oxide substrate species has been observed in both cases through electrochemical reduction process. XPS investigation has focused on the core-level energies and spectral profiles of the diffused substrate species into polymer matrix. A larger part of the diffused species is metal oxides in both cases determined by measuring chemical shifts of core-levels of In Sd5/2 and Sn Sd5/2. However, increase in lower binding energy components of In Sd5/2 and Sn Sd5/2 spectra of the diffused species indicates that the diffused species in polymer matrix are a mixture of metallic and oxide states of In and Sn. Furthermore, with regard to PT backbone-originated S 2p lines, a large splitting was observed indicating the large interaction between diffused metal oxides and sulfur sites of the polymer backbone.
AB - X-ray photoelectron spectroscopy (XPS) investigations of conducting polymer polythiophene (PT)/indium tin oxide (ITO) and PT/SnO2 interfaces have been conducted. Interfacial electrochemical diffusion of the metal oxide substrate species has been observed in both cases through electrochemical reduction process. XPS investigation has focused on the core-level energies and spectral profiles of the diffused substrate species into polymer matrix. A larger part of the diffused species is metal oxides in both cases determined by measuring chemical shifts of core-levels of In Sd5/2 and Sn Sd5/2. However, increase in lower binding energy components of In Sd5/2 and Sn Sd5/2 spectra of the diffused species indicates that the diffused species in polymer matrix are a mixture of metallic and oxide states of In and Sn. Furthermore, with regard to PT backbone-originated S 2p lines, a large splitting was observed indicating the large interaction between diffused metal oxides and sulfur sites of the polymer backbone.
KW - Interfaces
KW - Metal oxide film
KW - Polymer backbone
UR - http://www.scopus.com/inward/record.url?scp=0032679068&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032679068&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0032679068
VL - 144-145
SP - 360
EP - 365
JO - Applied Surface Science
JF - Applied Surface Science
SN - 0169-4332
IS - 0
ER -