PIXE and PIXE-induced XRF for chemical specification

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    Abstract

    Wavelength dispersive X-ray spectra with fine structures in the PIXE and PIXE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduced theoretically by introducing molecular orbital calculations, the shake-off and resonant orbital rearrangement (ROR) processes, together with the direct Coulomb interaction between projectiles and target atoms, and the self-absorption of emitted X-rays through the targets. Comparison between observed and theoretical spectra is given here for F and S atoms.

    Original languageEnglish
    Pages (from-to)1-7
    Number of pages7
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume150
    Issue number1-4
    Publication statusPublished - 1999 Apr 2

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    ASJC Scopus subject areas

    • Surfaces, Coatings and Films
    • Instrumentation
    • Surfaces and Interfaces

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