Polarimetric performance of Si/CdTe semiconductor Compton camera

Shin'Ichiro Takeda, Hirokazu Odaka, Junichiro Katsuta, Shin Nosuke Ishikawa, So Ichiro Sugimoto, Yuu Koseki, Shin Watanabe, Goro Sato, Motohide Kokubun, Tadayuki Takahashi, Kazuhiro Nakazawa, Yasushi Fukazawa, Hiroyasu Tajima, Hidenori Toyokawa

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γrays at SPring-8.

Original languageEnglish
Pages (from-to)619-627
Number of pages9
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume622
Issue number3
DOIs
Publication statusPublished - 2010 Oct 21

Keywords

  • Compton camera
  • Gamma-ray astronomy
  • Polarimeter

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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  • Cite this

    Takeda, SI., Odaka, H., Katsuta, J., Ishikawa, S. N., Sugimoto, S. I., Koseki, Y., Watanabe, S., Sato, G., Kokubun, M., Takahashi, T., Nakazawa, K., Fukazawa, Y., Tajima, H., & Toyokawa, H. (2010). Polarimetric performance of Si/CdTe semiconductor Compton camera. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 622(3), 619-627. https://doi.org/10.1016/j.nima.2010.07.077