Polarimetric performance of Si/CdTe semiconductor Compton camera

Shin'Ichiro Takeda, Hirokazu Odaka, Junichiro Katsuta, Shin Nosuke Ishikawa, So Ichiro Sugimoto, Yuu Koseki, Shin Watanabe, Goro Sato, Motohide Kokubun, Tadayuki Takahashi, Kazuhiro Nakazawa, Yasushi Fukazawa, Hiroyasu Tajima, Hidenori Toyokawa

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γrays at SPring-8.

Original languageEnglish
Pages (from-to)619-627
Number of pages9
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume622
Issue number3
DOIs
Publication statusPublished - 2010 Oct 21

Fingerprint

Cameras
cameras
Semiconductor materials
rays
Compton scattering
Semiconductor detectors
Astrophysics
Polarimeters
Spectral resolution
polarimeters
linear polarization
azimuth
spectral resolution
astrophysics
spatial resolution
prototypes
Polarization
high resolution
detectors
scattering

Keywords

  • Compton camera
  • Gamma-ray astronomy
  • Polarimeter

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Polarimetric performance of Si/CdTe semiconductor Compton camera. / Takeda, Shin'Ichiro; Odaka, Hirokazu; Katsuta, Junichiro; Ishikawa, Shin Nosuke; Sugimoto, So Ichiro; Koseki, Yuu; Watanabe, Shin; Sato, Goro; Kokubun, Motohide; Takahashi, Tadayuki; Nakazawa, Kazuhiro; Fukazawa, Yasushi; Tajima, Hiroyasu; Toyokawa, Hidenori.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 622, No. 3, 21.10.2010, p. 619-627.

Research output: Contribution to journalArticle

Takeda, SI, Odaka, H, Katsuta, J, Ishikawa, SN, Sugimoto, SI, Koseki, Y, Watanabe, S, Sato, G, Kokubun, M, Takahashi, T, Nakazawa, K, Fukazawa, Y, Tajima, H & Toyokawa, H 2010, 'Polarimetric performance of Si/CdTe semiconductor Compton camera', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 622, no. 3, pp. 619-627. https://doi.org/10.1016/j.nima.2010.07.077
Takeda, Shin'Ichiro ; Odaka, Hirokazu ; Katsuta, Junichiro ; Ishikawa, Shin Nosuke ; Sugimoto, So Ichiro ; Koseki, Yuu ; Watanabe, Shin ; Sato, Goro ; Kokubun, Motohide ; Takahashi, Tadayuki ; Nakazawa, Kazuhiro ; Fukazawa, Yasushi ; Tajima, Hiroyasu ; Toyokawa, Hidenori. / Polarimetric performance of Si/CdTe semiconductor Compton camera. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2010 ; Vol. 622, No. 3. pp. 619-627.
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