Polarization dependence of avalanche multiplication factor in 1.5 μm quantum dot waveguide photodetector

T. Umezawa, K. Akahane, A. Matsumoto, A. Kanno, N. Yamamoto, Tetsuya Kawanishi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We fabricated 1.5 μm quantum dot waveguide photodetector, and characterized the electrical and optical properties. It was found that the avalanche photocurrent strongly depends on TE/TM polarization.

    Original languageEnglish
    Title of host publication2016 Conference on Lasers and Electro-Optics, CLEO 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781943580118
    Publication statusPublished - 2016 Dec 16
    Event2016 Conference on Lasers and Electro-Optics, CLEO 2016 - San Jose, United States
    Duration: 2016 Jun 52016 Jun 10

    Other

    Other2016 Conference on Lasers and Electro-Optics, CLEO 2016
    CountryUnited States
    CitySan Jose
    Period16/6/516/6/10

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    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Cite this

    Umezawa, T., Akahane, K., Matsumoto, A., Kanno, A., Yamamoto, N., & Kawanishi, T. (2016). Polarization dependence of avalanche multiplication factor in 1.5 μm quantum dot waveguide photodetector. In 2016 Conference on Lasers and Electro-Optics, CLEO 2016 [7788750] Institute of Electrical and Electronics Engineers Inc..