Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001)

Mitsumasa Nakajima, Takashi Fujisawa, Ken Nishida, Takashi Yamamoto, Minoru Osada, Hiroshi Naganuma, Soichiro Okamura, Hiroshi Funakubo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

(100)/(001)-Oriented PZT thick films were grown on SrRuO3//(100) SrTiO3 and (100) MgO substrates by matel organic chemical vapor deposition (MOCVD) with different volume fraction of (001) orientation, and were compared with (001) single-oriented epitaxial PZT thick films grown on SrRuO3//LaNiO3//(100) CaF2 by polarized Raman spectroscopy. The spectra from (100)-oriented domain and (001)-oriented domain can be individually observed for the films with the mixture orientation of (100)/(001). Raman analysis revealed the different strain state of (100)-oriented and (001)-oriented domains. Moreover, the rotation dependence of A1(1TO) mode could be explained by the calculation using the volume fraction of (001)-oriented domains obtained from X-ray reciprocal space mapping analysis for the films with the mixture orientation of (100)/(001). These results suggest the local structure characterized by Raman spectroscopy almost agreed with the structure characterized by XRD analysis for the films with the mixture orientation of (100)/(001).

Original languageEnglish
Title of host publicationKey Engineering Materials
Pages99-102
Number of pages4
Volume421-422
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan - Tsukuba, Japan
Duration: 2008 Oct 222008 Oct 24

Publication series

NameKey Engineering Materials
Volume421-422
ISSN (Print)10139826

Other

Other6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan
CountryJapan
CityTsukuba
Period08/10/2208/10/24

Fingerprint

Epitaxial films
Thick films
Crystal orientation
Raman spectroscopy
Volume fraction
Organic Chemicals
Organic chemicals
Chemical vapor deposition
X rays
Substrates

Keywords

  • Epitaxial PZT film
  • MOCVD
  • Raman spectroscopy

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Nakajima, M., Fujisawa, T., Nishida, K., Yamamoto, T., Osada, M., Naganuma, H., ... Funakubo, H. (2010). Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001). In Key Engineering Materials (Vol. 421-422, pp. 99-102). (Key Engineering Materials; Vol. 421-422). https://doi.org/10.4028/www.scientific.net/KEM.421-422.99

Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001). / Nakajima, Mitsumasa; Fujisawa, Takashi; Nishida, Ken; Yamamoto, Takashi; Osada, Minoru; Naganuma, Hiroshi; Okamura, Soichiro; Funakubo, Hiroshi.

Key Engineering Materials. Vol. 421-422 2010. p. 99-102 (Key Engineering Materials; Vol. 421-422).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nakajima, M, Fujisawa, T, Nishida, K, Yamamoto, T, Osada, M, Naganuma, H, Okamura, S & Funakubo, H 2010, Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001). in Key Engineering Materials. vol. 421-422, Key Engineering Materials, vol. 421-422, pp. 99-102, 6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan, Tsukuba, Japan, 08/10/22. https://doi.org/10.4028/www.scientific.net/KEM.421-422.99
Nakajima M, Fujisawa T, Nishida K, Yamamoto T, Osada M, Naganuma H et al. Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001). In Key Engineering Materials. Vol. 421-422. 2010. p. 99-102. (Key Engineering Materials). https://doi.org/10.4028/www.scientific.net/KEM.421-422.99
Nakajima, Mitsumasa ; Fujisawa, Takashi ; Nishida, Ken ; Yamamoto, Takashi ; Osada, Minoru ; Naganuma, Hiroshi ; Okamura, Soichiro ; Funakubo, Hiroshi. / Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001). Key Engineering Materials. Vol. 421-422 2010. pp. 99-102 (Key Engineering Materials).
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