@inproceedings{dc406c064f1e47e29b4c324b4fa30984,
title = "Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001)",
abstract = "(100)/(001)-Oriented PZT thick films were grown on SrRuO3//(100) SrTiO3 and (100) MgO substrates by matel organic chemical vapor deposition (MOCVD) with different volume fraction of (001) orientation, and were compared with (001) single-oriented epitaxial PZT thick films grown on SrRuO3//LaNiO3//(100) CaF2 by polarized Raman spectroscopy. The spectra from (100)-oriented domain and (001)-oriented domain can be individually observed for the films with the mixture orientation of (100)/(001). Raman analysis revealed the different strain state of (100)-oriented and (001)-oriented domains. Moreover, the rotation dependence of A1(1TO) mode could be explained by the calculation using the volume fraction of (001)-oriented domains obtained from X-ray reciprocal space mapping analysis for the films with the mixture orientation of (100)/(001). These results suggest the local structure characterized by Raman spectroscopy almost agreed with the structure characterized by XRD analysis for the films with the mixture orientation of (100)/(001).",
keywords = "Epitaxial PZT film, MOCVD, Raman spectroscopy",
author = "Mitsumasa Nakajima and Takashi Fujisawa and Ken Nishida and Takashi Yamamoto and Minoru Osada and Hiroshi Naganuma and Soichiro Okamura and Hiroshi Funakubo",
year = "2010",
doi = "10.4028/www.scientific.net/KEM.421-422.99",
language = "English",
isbn = "0878493069",
volume = "421-422",
series = "Key Engineering Materials",
pages = "99--102",
booktitle = "Key Engineering Materials",
note = "6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan ; Conference date: 22-10-2008 Through 24-10-2008",
}