Post-silicon clock deskew employing hot-carrier injection trimming with on-chip skew monitoring and auto-stressing scheme for sub/near threshold digital circuits

Yu Pu, Xin Zhang, Katsuyuki Ikeuchi, Atsushi Muramatsu, Atsushi Kawasumi, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai

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Engineering & Materials Science