Post-Silicon Programmed Body-Biasing Platform suppressing device variability in 45 nm CMOS technology

Hiroaki Suzuki, Masanori Kurimoto, Tadao Yamanaka, Hidehiro Takata, Hiroshi Makino, Hirofumi Shinohara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Post-Silicon Programmed Body-Biasing Platform suppressing device variability in 45 nm CMOS technology'. Together they form a unique fingerprint.

Engineering & Materials Science