Pressure Measurement by Photoelectron Counting

Shigeyuki Sekine, Kiyohide Kokubun, Shingo Ichimura, Hazime Shimizu

Research output: Contribution to journalArticle

Abstract

The measurement of gas pressure in ultrahigh vacuum was carried out by detecting laser-generated photoelectrons. Xenon atoms filling a vacuum chamber were nonresonantly ionized by a picosecond laser pulse. The laser intensity dependence of the number of ions produced was measured, and almost all xenon atoms in a focal area were found to be ionized. The number of photoelectrons produced was also measured as a function of xenon pressure. The signal intensity was proportional to xenon pressure in the range from 10-2 to 10-7 Pa.

Original languageEnglish
Pages (from-to)714-717
Number of pages4
JournalShinku
Volume37
Issue number9
DOIs
Publication statusPublished - 1994 Jan 1
Externally publishedYes

Fingerprint

Xenon
pressure measurement
Pressure measurement
Photoelectrons
xenon
counting
photoelectrons
lasers
Atoms
Lasers
Ultrahigh vacuum
vacuum chambers
ultrahigh vacuum
gas pressure
atoms
Laser pulses
Gases
Vacuum
Ions
pulses

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Pressure Measurement by Photoelectron Counting. / Sekine, Shigeyuki; Kokubun, Kiyohide; Ichimura, Shingo; Shimizu, Hazime.

In: Shinku, Vol. 37, No. 9, 01.01.1994, p. 714-717.

Research output: Contribution to journalArticle

Sekine, S, Kokubun, K, Ichimura, S & Shimizu, H 1994, 'Pressure Measurement by Photoelectron Counting', Shinku, vol. 37, no. 9, pp. 714-717. https://doi.org/10.3131/jvsj.37.714
Sekine, Shigeyuki ; Kokubun, Kiyohide ; Ichimura, Shingo ; Shimizu, Hazime. / Pressure Measurement by Photoelectron Counting. In: Shinku. 1994 ; Vol. 37, No. 9. pp. 714-717.
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