Pressure measurement method using laser ionization for xhv

K. Kokubun, Shingo Ichimura, H. Shimizu, S. Sekine

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

A pressure measurement method for xhv using laser ionization has been developed. By means of nonresonant multiphonon ionization, the proportional relation between the amount of laser-generated ions and the gas pressure is experimentally verified in the range 1 × 10-3-2 × 10-8 Pa. Also, a nonresonant 4-photon ionization of the He atom, which has the highest ionization potential of all atoms and molecules, and saturations of ionization for Xe, Kr, O2 and especially for H2, which is a main residual molecule in uhv and xhv, are successfully observed. In addition, a high-sensitivity ion-detection system for the exact measurement of several atoms and molecules in xhv is prepared. Noise due to scattered laser light is discussed.

Original languageEnglish
Pages (from-to)657-659
Number of pages3
JournalVacuum
Volume44
Issue number5-7
DOIs
Publication statusPublished - 1993 Jan 1
Externally publishedYes

Fingerprint

pressure measurement
Pressure measurement
Ionization
ionization
Lasers
Atoms
Molecules
lasers
Ions
atoms
molecules
Ionization potential
ionization potentials
gas pressure
ions
Photons
Gases
saturation
sensitivity
photons

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

Cite this

Pressure measurement method using laser ionization for xhv. / Kokubun, K.; Ichimura, Shingo; Shimizu, H.; Sekine, S.

In: Vacuum, Vol. 44, No. 5-7, 01.01.1993, p. 657-659.

Research output: Contribution to journalArticle

Kokubun, K. ; Ichimura, Shingo ; Shimizu, H. ; Sekine, S. / Pressure measurement method using laser ionization for xhv. In: Vacuum. 1993 ; Vol. 44, No. 5-7. pp. 657-659.
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