Probabilistic fault diagnosis and its analysis in multicomputer systems

Manabu Kobayashi; Toshiyasu Matsushima; Shigeichi Hirasawa

doi:10.1587/transfun.E101.A.2072

Probabilistic fault diagnosis and its analysis in multicomputer systems

Manabu Kobayashi, Toshiyasu Matsushima, Shigeichi Hirasawa

Research output: Contribution to journal › Article › peer-review

Abstract

F.P. Preparata et al. have proposed a fault diagnosis model to find all faulty units in the multicomputer system by using outcomes which each unit tests some other units. In this paper, for probabilistic diagnosis models, we show an efficient diagnosis algorithm to obtain a posteriori probability that each of units is faulty given the test outcomes. Furthermore, we propose a method to analyze the diagnostic error probability of this algorithm.

Original language	English
Pages (from-to)	2072-2081
Number of pages	10
Journal	IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume	E101A
Issue number	12
DOIs	https://doi.org/10.1587/transfun.E101.A.2072
Publication status	Published - 2018 Dec

Keywords

Density evolution
Intermittent faults
Multicomputer systems
Proba-bilistic fault diagnosis
System-level fault diagnosis

ASJC Scopus subject areas

Signal Processing
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering
Applied Mathematics

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title = "Probabilistic fault diagnosis and its analysis in multicomputer systems",

abstract = "F.P. Preparata et al. have proposed a fault diagnosis model to find all faulty units in the multicomputer system by using outcomes which each unit tests some other units. In this paper, for probabilistic diagnosis models, we show an efficient diagnosis algorithm to obtain a posteriori probability that each of units is faulty given the test outcomes. Furthermore, we propose a method to analyze the diagnostic error probability of this algorithm.",

keywords = "Density evolution, Intermittent faults, Multicomputer systems, Proba-bilistic fault diagnosis, System-level fault diagnosis",

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note = "Funding Information: This work was supported in part by Grants-in-Aid for Scientific Research from KAKENHI (16K00491).",

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AU - Hirasawa, Shigeichi

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