Probing intrinsic polarization properties in bismuth-layered ferroelectric films

Takayuki Watanabe, Hiroshi Funakubo, Minoru Osada, Hiroshi Uchida, Isao Okada, Brian J. Rodriguez, Alexei Gruverman

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

The authors report on an approach to establish intrinsic polarization properties in bismuth-layered ferroelectric films by piezoelectric coefficient and soft-mode spectroscopy, as well as by a direct polarization-electric field hysteresis. In epitaxially grown (Bi4-x Ndx) Ti3 O12 (0≤x≤0.73) films, they show that these complementary characterizations can phenomenologically and thermodynamically represent the intrinsic polarization states in (Bi4-x Ndx) Ti3 O12 films, and the intrinsic Ps of 67 μC cm2 is estimated for pure Bi4 Ti3 O12, superior to 50 μC cm2 in bulk single crystal. Their results provide a pathway to draw full potential in ferroelectric thin films.

Original languageEnglish
Article number112914
JournalApplied Physics Letters
Volume90
Issue number11
DOIs
Publication statusPublished - 2007
Externally publishedYes

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bismuth
polarization
hysteresis
electric fields
single crystals
coefficients
thin films
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Watanabe, T., Funakubo, H., Osada, M., Uchida, H., Okada, I., Rodriguez, B. J., & Gruverman, A. (2007). Probing intrinsic polarization properties in bismuth-layered ferroelectric films. Applied Physics Letters, 90(11), [112914]. https://doi.org/10.1063/1.2713858

Probing intrinsic polarization properties in bismuth-layered ferroelectric films. / Watanabe, Takayuki; Funakubo, Hiroshi; Osada, Minoru; Uchida, Hiroshi; Okada, Isao; Rodriguez, Brian J.; Gruverman, Alexei.

In: Applied Physics Letters, Vol. 90, No. 11, 112914, 2007.

Research output: Contribution to journalArticle

Watanabe, T, Funakubo, H, Osada, M, Uchida, H, Okada, I, Rodriguez, BJ & Gruverman, A 2007, 'Probing intrinsic polarization properties in bismuth-layered ferroelectric films', Applied Physics Letters, vol. 90, no. 11, 112914. https://doi.org/10.1063/1.2713858
Watanabe T, Funakubo H, Osada M, Uchida H, Okada I, Rodriguez BJ et al. Probing intrinsic polarization properties in bismuth-layered ferroelectric films. Applied Physics Letters. 2007;90(11). 112914. https://doi.org/10.1063/1.2713858
Watanabe, Takayuki ; Funakubo, Hiroshi ; Osada, Minoru ; Uchida, Hiroshi ; Okada, Isao ; Rodriguez, Brian J. ; Gruverman, Alexei. / Probing intrinsic polarization properties in bismuth-layered ferroelectric films. In: Applied Physics Letters. 2007 ; Vol. 90, No. 11.
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