Profiling node conditions of distributed system with sequential pattern mining

Yu Hirate, Hayato Yamana

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, with wide-spread of distributed systems, distributed monitoring systems are needed to mange such systems. However, since monitoring architecture of distributed system faces a huge amount of log data which come from local computing nodes, information aggregation is fundamental scheme for monitoring distributed system. In this paper, we preset a novel approach for extracting computing node-condition profiles by using sequential pattern mining, which is one of data mining techniques. Extracted computing node condition profiles represent node condition patterns which are occurred in many computing nodes frequently. Thus, extracted profiles enable summarized distributed system conditions to be small sized and easy-understandable information.

Original languageEnglish
Title of host publicationProceedings - 1st International Workshop on Software Technologies for Future Dependable Distributed Systems, STFSSD 2009
Pages43-48
Number of pages6
DOIs
Publication statusPublished - 2009 Dec 1
Event1st International Workshop on Software Technologies for Future Dependable Distributed Systems, STFSSD 2009 - Tokyo, Japan
Duration: 2009 Mar 172009 Mar 18

Publication series

NameProceedings - 1st International Workshop on Software Technologies for Future Dependable Distributed Systems, STFSSD 2009

Conference

Conference1st International Workshop on Software Technologies for Future Dependable Distributed Systems, STFSSD 2009
Country/TerritoryJapan
CityTokyo
Period09/3/1709/3/18

Keywords

  • Data Mining
  • Distributed System
  • Monitoring System
  • Sequential Pattern Mining

ASJC Scopus subject areas

  • Hardware and Architecture
  • Information Systems

Fingerprint

Dive into the research topics of 'Profiling node conditions of distributed system with sequential pattern mining'. Together they form a unique fingerprint.

Cite this