Propagation loss reduction of ZnMgTe/ZnTe waveguide devices

Wei Che Sun, Fukino Kazami, Jing Wang, Taizo Nakasu, Shota Hattori, Takeru Kizu, Yuki Hashimoto, Masakazu Kobayashi, Toshiaki Asahi

    Research output: Contribution to journalArticle

    2 Citations (Scopus)

    Abstract

    A ZnMgTe/ZnTe electro-optic (EO) waveguide has great potential to be utilized for practical applications. A low-dislocation ZnMgTe/ZnTe waveguide can be fabricated when the cladding layer thickness is below 20-fold the calculated critical layer thickness (CCLT × 20). To improve optical confinement, a waveguide with a thicker cladding layer or a higher Mg% should be considered. However, the device performance might be affected because of crystal quality deterioration since the lattice mismatch between MgTe and ZnTe was around 4.1%. In this study, optical confinement and propagation loss were examined by changing the dimensions of the ZnMgTe/ZnTe waveguide structure. The propagation loss, EO characteristics, and crystal quality of the fabricated waveguides were mainly studied. A waveguide with a cladding layer thickness of around 1.5-fold the 1/e penetration depth of the evanescent wave (dp1/e × 1.5, corresponding to CCLT × 100) showed better optical properties than other waveguides, although its interface defect density was reasonably high.

    Original languageEnglish
    Article number082201
    JournalJapanese Journal of Applied Physics
    Volume55
    Issue number8
    DOIs
    Publication statusPublished - 2016 Aug 1

    Fingerprint

    Waveguides
    waveguides
    propagation
    Electrooptical effects
    electro-optics
    Crystals
    Lattice mismatch
    Defect density
    evanescent waves
    deterioration
    crystals
    Deterioration
    penetration
    Optical properties
    optical properties
    defects

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

    Cite this

    Sun, W. C., Kazami, F., Wang, J., Nakasu, T., Hattori, S., Kizu, T., ... Asahi, T. (2016). Propagation loss reduction of ZnMgTe/ZnTe waveguide devices. Japanese Journal of Applied Physics, 55(8), [082201]. https://doi.org/10.7567/JJAP.55.082201

    Propagation loss reduction of ZnMgTe/ZnTe waveguide devices. / Sun, Wei Che; Kazami, Fukino; Wang, Jing; Nakasu, Taizo; Hattori, Shota; Kizu, Takeru; Hashimoto, Yuki; Kobayashi, Masakazu; Asahi, Toshiaki.

    In: Japanese Journal of Applied Physics, Vol. 55, No. 8, 082201, 01.08.2016.

    Research output: Contribution to journalArticle

    Sun, WC, Kazami, F, Wang, J, Nakasu, T, Hattori, S, Kizu, T, Hashimoto, Y, Kobayashi, M & Asahi, T 2016, 'Propagation loss reduction of ZnMgTe/ZnTe waveguide devices', Japanese Journal of Applied Physics, vol. 55, no. 8, 082201. https://doi.org/10.7567/JJAP.55.082201
    Sun WC, Kazami F, Wang J, Nakasu T, Hattori S, Kizu T et al. Propagation loss reduction of ZnMgTe/ZnTe waveguide devices. Japanese Journal of Applied Physics. 2016 Aug 1;55(8). 082201. https://doi.org/10.7567/JJAP.55.082201
    Sun, Wei Che ; Kazami, Fukino ; Wang, Jing ; Nakasu, Taizo ; Hattori, Shota ; Kizu, Takeru ; Hashimoto, Yuki ; Kobayashi, Masakazu ; Asahi, Toshiaki. / Propagation loss reduction of ZnMgTe/ZnTe waveguide devices. In: Japanese Journal of Applied Physics. 2016 ; Vol. 55, No. 8.
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