PROPAGATION PROPERTIES OF FLUXONS IN A WELL-DAMPED JOSEPHSON TRANSMISSION LINE.

J. Nitta, Azusa Matsuda, T. Kawakami

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Fluxon threshold properties and propagation velocities have been studied with regard to Josephson transmission line (JTL) having an external shunt resistance parallel to the Nb/Nb-oxide/Pb junction. Stable and separated multifluxon waveforms have been observed in the well damped JTL. Experimentally obtained thresholds for the number of propagated fluxons and interval times between each respective fluxon agree with numerical simulations. The dependence of fluxon propagation velocities on the bias current level can be interpreted in terms of the McLaughlin-Scott theory.

Original languageEnglish
Pages (from-to)2758-2762
Number of pages5
JournalJournal of Applied Physics
Volume55
Issue number7
DOIs
Publication statusPublished - 1984 Apr 1
Externally publishedYes

Fingerprint

propagation velocity
transmission lines
thresholds
propagation
shunts
waveforms
intervals
oxides
simulation

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

Cite this

PROPAGATION PROPERTIES OF FLUXONS IN A WELL-DAMPED JOSEPHSON TRANSMISSION LINE. / Nitta, J.; Matsuda, Azusa; Kawakami, T.

In: Journal of Applied Physics, Vol. 55, No. 7, 01.04.1984, p. 2758-2762.

Research output: Contribution to journalArticle

@article{72708ffa650e4a97ac9978de6a102e5e,
title = "PROPAGATION PROPERTIES OF FLUXONS IN A WELL-DAMPED JOSEPHSON TRANSMISSION LINE.",
abstract = "Fluxon threshold properties and propagation velocities have been studied with regard to Josephson transmission line (JTL) having an external shunt resistance parallel to the Nb/Nb-oxide/Pb junction. Stable and separated multifluxon waveforms have been observed in the well damped JTL. Experimentally obtained thresholds for the number of propagated fluxons and interval times between each respective fluxon agree with numerical simulations. The dependence of fluxon propagation velocities on the bias current level can be interpreted in terms of the McLaughlin-Scott theory.",
author = "J. Nitta and Azusa Matsuda and T. Kawakami",
year = "1984",
month = "4",
day = "1",
doi = "10.1063/1.333282",
language = "English",
volume = "55",
pages = "2758--2762",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

TY - JOUR

T1 - PROPAGATION PROPERTIES OF FLUXONS IN A WELL-DAMPED JOSEPHSON TRANSMISSION LINE.

AU - Nitta, J.

AU - Matsuda, Azusa

AU - Kawakami, T.

PY - 1984/4/1

Y1 - 1984/4/1

N2 - Fluxon threshold properties and propagation velocities have been studied with regard to Josephson transmission line (JTL) having an external shunt resistance parallel to the Nb/Nb-oxide/Pb junction. Stable and separated multifluxon waveforms have been observed in the well damped JTL. Experimentally obtained thresholds for the number of propagated fluxons and interval times between each respective fluxon agree with numerical simulations. The dependence of fluxon propagation velocities on the bias current level can be interpreted in terms of the McLaughlin-Scott theory.

AB - Fluxon threshold properties and propagation velocities have been studied with regard to Josephson transmission line (JTL) having an external shunt resistance parallel to the Nb/Nb-oxide/Pb junction. Stable and separated multifluxon waveforms have been observed in the well damped JTL. Experimentally obtained thresholds for the number of propagated fluxons and interval times between each respective fluxon agree with numerical simulations. The dependence of fluxon propagation velocities on the bias current level can be interpreted in terms of the McLaughlin-Scott theory.

UR - http://www.scopus.com/inward/record.url?scp=0021405866&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0021405866&partnerID=8YFLogxK

U2 - 10.1063/1.333282

DO - 10.1063/1.333282

M3 - Article

AN - SCOPUS:0021405866

VL - 55

SP - 2758

EP - 2762

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 7

ER -