Properties of M-AFM Probe Affected by Coatings Nanostructural Metal

Atsushi Hosoi, M. Hamada, A. Fujimoto, Y. Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In order to develop a new structure microwave probe, the fabrication of the atomic force microscope (AFM) probe on a GaAs wafer was studied and characteristics of the AFM probe with different nanostructural metal coating were evaluated in order to understand the performance of the probe for the topography of materials and the propagation of microwave signals. The fabricated probe had a tip of 8 ìm high and curvature radius approximately 30 nm. The dimensions of the cantilever are 250×30×15 ìm. A waveguide was introduced by the sputtering and the electron beam (EB) evaporation technique on the top and bottom surfaces of the GaAs AFM probe with Au or Al film. The open structure of the waveguide at the tip of the probe was introduced by using focused ion beam (FIB) fabrication. AFM topography of a grating sample was measured by using each fabricated probe. It was found that the fabricated probes coated with the Au or Al film have nanometer order resolution. Moreover, using the Au-coating probe formed by the EB evaporation technique, microwave emission was detected successfully at the tipof the probe by approaching an Au film sample.

Original languageEnglish
Title of host publicationDTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS
Pages197-201
Number of pages5
Publication statusPublished - 2009
Externally publishedYes
Event2009 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, MEMS/MOEMS 2009 - Rome
Duration: 2009 Apr 12009 Apr 3

Other

Other2009 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, MEMS/MOEMS 2009
CityRome
Period09/4/109/4/3

Fingerprint

Metal coatings
Microscopes
Microwaves
Topography
Electron beams
Evaporation
Waveguides
Fabrication
Focused ion beams
Sputtering

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Hosoi, A., Hamada, M., Fujimoto, A., & Ju, Y. (2009). Properties of M-AFM Probe Affected by Coatings Nanostructural Metal. In DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (pp. 197-201). [4919534]

Properties of M-AFM Probe Affected by Coatings Nanostructural Metal. / Hosoi, Atsushi; Hamada, M.; Fujimoto, A.; Ju, Y.

DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS. 2009. p. 197-201 4919534.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hosoi, A, Hamada, M, Fujimoto, A & Ju, Y 2009, Properties of M-AFM Probe Affected by Coatings Nanostructural Metal. in DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS., 4919534, pp. 197-201, 2009 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, MEMS/MOEMS 2009, Rome, 09/4/1.
Hosoi A, Hamada M, Fujimoto A, Ju Y. Properties of M-AFM Probe Affected by Coatings Nanostructural Metal. In DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS. 2009. p. 197-201. 4919534
Hosoi, Atsushi ; Hamada, M. ; Fujimoto, A. ; Ju, Y. / Properties of M-AFM Probe Affected by Coatings Nanostructural Metal. DTIP of MEMS and MOEMS - Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS. 2009. pp. 197-201
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