Abstract
Novel methods are proposed to enlarge the vertical (normal to the plane of electron orbit) width of the exposed area in synchrotron radiation (SR) lithography. They are the shaping of the cross section of the SR beam by a fixed toroidal mirror with specified parameters and the superposition of the reflected SR beams from fixed planar mirrors onto the upper and lower peripheries of the straight beam. An experimental verification is presented, and merits and demerits of these methods are compared with those of other methods.
Original language | English |
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Title of host publication | Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena |
Pages | 232-236 |
Number of pages | 5 |
Volume | 3 |
Edition | 1 |
DOIs | |
Publication status | Published - 1984 Jan |
Externally published | Yes |
Event | Proc of the 1984 Int Symp on Electron, Ion, and Photon Beams - Tarrytown, NY, USA Duration: 1984 May 29 → 1984 Jun 1 |
Other
Other | Proc of the 1984 Int Symp on Electron, Ion, and Photon Beams |
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City | Tarrytown, NY, USA |
Period | 84/5/29 → 84/6/1 |
ASJC Scopus subject areas
- Engineering(all)