Provably-secure cancelable biometrics using 2-DNF evaluation

Mitsuhiro Hattori*, Nori Matsuda, Takashi Ito, Yoichi Shibata, Katsuyuki Takashima, Takeshi Yoneda

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

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Engineering & Materials Science